VAN OLMEN, Jan

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Full Name
VAN OLMEN, Jan
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jan.vanolmen@uhasselt.be
 
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Publications

Results 1-7 of 7 (Search time: 0.002 seconds).

Issue DateTitleContributor(s)TypeCat.
12007Electrical performance, reliability and microstructure of sub-45 nm copper damascene lines fabricated with TEOS backfillLeaming-Sphabmixay, K.; VAN OLMEN, Jan; Moon, K. J.; VANSTREELS, Kris; D'HAEN, Jan; Tokei, Z.; List, S.; Beyer, G.Journal ContributionA1
22000In-situ SEM observation of electromigration in thin metal films at accelerated stress conditionsD'HAEN, Jan; VAN OLMEN, Jan; BEELEN, Zjef; MANCA, Jean; MARTENS, Tom; DE CEUNINCK, Ward; D'OLIESLAEGER, Marc; DE SCHEPPER, Luc; Cannaerts, M; Maex, KJournal ContributionA1
31999The kinetics of the early stages of electromigration and concurrent temperature induced processes in thin film metallisations studied by means of an in-situ high resolution resistometric techniqueVAN OLMEN, Jan; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; D'Haeger, V; Witvrouw, A; Maex, K; Vandevelde, B; Beyne, E; Tielemans, LJournal Contribution
41998The influence of addition elements on the early resistance changes observed during electromigration testing of Al metal linesDE CEUNINCK, Ward; D'Haeger, V; VAN OLMEN, Jan; Witvrouw, A; Maex, K; DE SCHEPPER, Luc; De Pauw, P; Pergoot, AJournal Contribution
51998Overview of the kinetics of the early stages of electromigration under low (= realistic) current density stressVAN OLMEN, Jan; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; D'Haeger, V; Witvrouw, A; Maex, KJournal Contribution
61997The thermally balanced bridge technique (TBBT): A new high resolution resistometric measurement technique for the study of electromigration-induced early resistance changes in metal stripesVAN OLMEN, Jan; DE CEUNINCK, Ward; DE SCHEPPER, Luc; GOLDONI, Alessandro; Cervini, A; Fantini, FJournal Contribution
71997Design of a new test structure for the study of electromigration with early resistance change measurementsDE CEUNINCK, Ward; MANCA, Jean; D'Haeger, V; VAN OLMEN, Jan; DE SCHEPPER, Luc; STALS, LambertJournal Contribution