STALS, Lambert

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STALS, Lambert
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lambert.stals@uhasselt.be
 
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Publications

Results 101-120 of 141 (Search time: 0.01 seconds).

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Issue DateTitleContributor(s)TypeCat.
1011995Study of the residual macroscopic stress in TiN coatings deposited on various steel types (tuSA1)QUAEYHAEGENS, Carl; KNUYT, Gilbert; STALS, LambertJournal Contribution
1021995Experimental-study of the growth evolution from random towards a (111) preferential orientation of PVD TiN coatingsQUAEYHAEGENS, Carl; KNUYT, Gilbert; D'HAEN, Jan; STALS, LambertJournal Contribution
1031995Subgap optical-absorption in CVD diamond films determined from photothermal deflection spectroscopyNESLADEK, Milos; VANECEK, M; ROSA, J; QUAEYHAEGENS, Carl; STALS, LambertJournal Contribution
1041995Deposition and properties of thick corrosion and wear-resistant Ti2N coatingsVAN STAPPEN, M; DE BRUYN, Kris; QUAEYHAEGENS, Carl; STALS, Lambert; POULEK, VJournal Contribution
1051995Promising developments for new applications: duplex, low temperature TiN and Ti2NKERKHOFS, M.; van Stappen, M.; QUAEYHAEGENS, Carl; STALS, LambertConference Material
1061995Delamination of diamond coatings under thermal stressKNUYT, Gilbert; VANDIERENDONCK, Kristine; QUAEYHAEGENS, Carl; NESLADEK, Milos; STALS, LambertConference Material
1071995Influence of the presence of white layers formed during grinding and wire-electro-discharge machining on PVD TiN coating adhesionPALMERS, J; VANSTAPPEN, M; D'HAEN, Jan; D'OLIESLAEGER, Marc; STALS, Lambert; UHLIG, G; FOLLER, M; HABERLING, EJournal Contribution
1081995In-situ failure-detection in thick-film multilayer systemsMANCA, Jean; DE SCHEPPER, Luc; DE CEUNINCK, Ward; D'OLIESLAEGER, Marc; STALS, LambertJournal Contribution
1091995Structure analysis of plasma nitrited pure ironD'HAEN, Jan; QUAEYHAEGENS, Carl; KNUYT, Gilbert; D'OLIESLAEGER, Marc; STALS, LambertJournal Contribution
1101994The use of early resistance and early tcr changes to predict the reliability of on-chip interconnectsD'Haeger, V; Stulens, Herwig; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Tielemans, L; Gallopyn, G; Depauw P; STALS, LambertJournal Contribution
1111994An activation-energy study of the microstructural changes in al-1-percent-si interconnectsStulens, Herwig; KNUYT, Gilbert; DE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
1121994Investigation of nitride phases in stainless-steels by nuclear-reaction analysis and X-ray-diffractionBODART, F; BRIGLIA, T; QUAEYHAEGENS, Carl; D'HAEN, Jan; STALS, LambertJournal Contribution
1131994Study of the ion energy-distribution during physical vapor-deposition of TiNNESLADEK, Milos; QUAEYHAEGENS, Carl; WOUTERS, Stan; STALS, Lambert; Bergmann, E.; RETTINGHAUS, GJournal Contribution
1141994Reliability study of on-chip interconnects - prediction of electromigration resistance on a short-time scaleDE CEUNINCK, Ward; D'Haeger, V; Stulens, Herwig; DE SCHEPPER, Luc; STALS, LambertProceedings Paper
1151994The performance of (Ti,Al)N-coated flowdrillsKERKHOFS, M; VANSTAPPEN, M; D'OLIESLAEGER, Marc; QUAEYHAEGENS, Carl; STALS, LambertJournal Contribution
561993Exceptions to the microstructure zone model revealed by the reactive dc magnetron sputter-deposition of delta-TiNx thin-filmsPOULEK, V; QUAEYHAEGENS, Carl; KNUYT, Gilbert; STALS, Lambert; FAGARD, VeroniqueJournal Contribution
571993Derivation of an activation-energy spectrum for defect processes from isothermal measurements, using a minimization principle and Fourier-analysisKNUYT, Gilbert; Stulens, Herwig; DE CEUNINCK, Ward; STALS, LambertJournal Contribution
581993Coating thickness and surface-roughness of TiN-coated high-speed steel in relation to coating functionalityDE BRUYN, Kris; CELIS, JP; ROOS, JR; STALS, Lambert; VANSTAPPEN, MJournal Contribution
591993Electric-field relaxation in prolonged-time photocurrent experimentsSCHAUER, F; BRADA, P; Adriaenssens, G.J.; NESLADEK, Milos; STALS, LambertJournal Contribution
601993An interface study of various PVD TiN coatings on plasma-nitrided austenitic stainless-steel AISI 304D'HAEN, Jan; QUAEYHAEGENS, Carl; KNUYT, Gilbert; DE SCHEPPER, Luc; STALS, Lambert; VANSTAPPEN, MJournal Contribution
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