STALS, Lambert

Full Name
STALS, Lambert
Email
lambert.stals@uhasselt.be
 
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Publications

Results 61-80 of 143 (Search time: 0.021 seconds).

Issue DateTitleContributor(s)TypeCat.
611997Current industrial practice critical issues in hard PVD and PA-CVD coatingsSTALS, Lambert; NESLADEK, Milos; QUAEYHAEGENS, CarlJournal Contribution
621997On the {111} <111> penetration twin density in CVD diamond filmsKNUYT, Gilbert; NESLADEK, Milos; MEYKENS, Kristien; QUAEYHAEGENS, Carl; STALS, LambertJournal Contribution
631997Transient nucleation of diamond: theoretical and experimental studyDemo, P; Kozisek, Z; Vanecek, M; Rosa, J; MEYKENS, Kristien; NESLADEK, Milos; QUAEYHAEGENS, Carl; KNUYT, Gilbert; STALS, LambertJournal Contribution
641997On the development of CVD diamond film morphology due to the twinning on {111} surfacesKNUYT, Gilbert; NESLADEK, Milos; Vandevelde, Thierry; MEYKENS, Kristien; QUAEYHAEGENS, Carl; STALS, LambertJournal Contribution
651997CVD diamond coated WC-Co tools: an adhesion studyNESLADEK, Milos; QUAEYHAEGENS, Carl; STALS, Lambert; van Stappen, M.Proceedings Paper
661997Quantitative study of Raman scattering and defect optical absorption in CVD diamond filmsVorlicek, V; Rosa, J; Vanecek, M; NESLADEK, Milos; STALS, LambertJournal Contribution
671997Diamond films for electronic applicationsMEYKENS, Kristien; NESLADEK, Milos; QUAEYHAEGENS, Carl; STALS, LambertProceedings Paper
681997Critical issues in hard PVD and PA-CVD coatingsSTALS, Lambert; NESLADEK, Milos; QUAEYHAEGENS, CarlJournal Contribution
691997Optical emission spectroscopy of the plasma during microwave CVD of diamond thin films with nitrogen addition and relation to the thin film morphologyVandevelde, Thierry; NESLADEK, Milos; QUAEYHAEGENS, Carl; STALS, LambertJournal Contribution
701996Electrical characterisation and reliability studies of thick film gas sensor structures.CZECH, Jan; MANCA, Jean; Roggen J; Huyberechts G; STALS, Lambert; DE SCHEPPER, LucProceedings Paper
711996A new technique to characterize the early stages of electromigration-induced resistance changes at low current densitiesDHaeger, V; DE CEUNINCK, Ward; KNUYT, Gilbert; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
721996Quantitative analysis of the compound layer of plasma nitrided pure ironD'HAEN, Jan; D'OLIESLAEGER, Marc; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
731996Study of nitrogen-implanted stainless steels by CEMS and TEMBriglia, T; Terwagne, G; Bodart, F; QUAEYHAEGENS, Carl; D'HAEN, Jan; STALS, LambertJournal Contribution
741996A diffusion model of metal surface modification during plasma nitridingDimitrov, VI; D'HAEN, Jan; KNUYT, Gilbert; QUAEYHAEGENS, Carl; STALS, LambertJournal Contribution
751996A model for thin film texture evolution driven by surface energy effectsKNUYT, Gilbert; QUAEYHAEGENS, Carl; D'HAEN, Jan; STALS, LambertJournal Contribution
761996Promising developments for new applicationsQUAEYHAEGENS, Carl; Kerkhofs, M; STALS, Lambert; Van Stappen, MJournal Contribution
771996Monte Carlo simulation of the formation of MCs(+) molecular ionsVLEKKEN, Johan; WU, Ting-Di; D'OLIESLAEGER, Marc; KNUYT, Gilbert; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
781996Study of the microstructure of IC interconnect metallisations using analytical transmission electron microscopy and secondary ion mass spectrometryCOSEMANS, Patrick Peter; D'OLIESLAEGER, Marc; DE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
791996Residual macroscopic stress in highly preferentially oriented titanium nitride coatings deposited on various steel typesQUAEYHAEGENS, Carl; KNUYT, Gilbert; STALS, LambertJournal Contribution
801996Characterization of the early stages of electromigration in Al-based metal lines by means of a high resloution resistance monitoring technique based on an extremely stable ambient temperatureDE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, Lambert; d' Haeger, V.Proceedings Paper