DE CEUNINCK, Ward

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Full Name
DE CEUNINCK, Ward
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ward.deceuninck@uhasselt.be
 
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Publications

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Type:  Proceedings Paper
Date Issued:  [2000 TO 2009]

Results 1-11 of 11 (Search time: 0.003 seconds).

Issue DateTitleContributor(s)TypeCat.
12008The influence of different surface terminations on electrical transport and emission properties for freestanding single crystalline (100) CVD diamond samplesDEFERME, Wim; BOGDAN, Anna; HAENEN, Ken; DE CEUNINCK, Ward; Flipse, K.; NESLADEK, MilosProceedings PaperC1
22007Microstructural evolution of cu interconnect under AC, pulsed DC and DC current stressBIESEMANS, Leen; VANSTREELS, Kris; BRONGERSMA, Sywert; D'HAEN, Jan; DE CEUNINCK, Ward; D'OLIESLAEGER, MarcProceedings PaperC1
32007High sputter bias super secondary grain growth initiation (In structures)VANSTREELS, Kris; BRONGERSMA, Sywert; D'HAEN, Jan; DEMUYNCK, Steven; DE CEUNINCK, Ward; CALUWAERTS, Rudi; D'OLIESLAEGER, MarcProceedings PaperC1
42007Study of time-dependent dielectric breakdown on gate oxide capacitors at high temperatureMOONEN, Rob; Vanmeerbeek, P; LEKENS, Geert; DE CEUNINCK, Ward; Moens, P.; Boutsen, J.Proceedings PaperC1
52007Electrical transport and defect spectroscopy of free standing single crystal CVD diamond prepared from methane rich mixturesBOGDAN, Andrey; BOGDAN, Anna; DE CEUNINCK, Ward; HAENEN, Ken; NESLADEK, MilosProceedings PaperC1
62006Super secondary grain growth initiation in electroplated copperVANSTREELS, Kris; Brongersma, SH; Demuynck, S; Carbonell, L; D'HAEN, Jan; DE CEUNINCK, Ward; D'OLIESLAEGER, Marc; Maex, KProceedings PaperC1
72004Super secondary grain growth in the barrier/seedlayer systemVANSTREELS, Kris; Brongersma, S.H.; Demuynck, S.; D'HAEN, Jan; DE CEUNINCK, Ward; D'OLIESLAEGER, Marc; Maex, KarenProceedings PaperC1
82004A new method for the lifetime determination of submicron metal interconnects by means of a parallel test structureVANSTREELS, Kris; D'OLIESLAEGER, Marc; DE CEUNINCK, Ward; D'HAEN, Jan; Maex, KarenProceedings PaperC1
92003Advantage of in-situ to ex-situ techniques as reliability tool: aging kinetcs of Imec's MCM-D discrete passive devicesSoussan, P.; LEKENS, Geert; DREESEN, Raf; DE CEUNINCK, Ward; Beyne, E.Proceedings PaperC2
102003Copper deposition and subsequent grain structure evolution in narrow linesBrongersma, SH; D'HAEN, Jan; VANSTREELS, Kris; DE CEUNINCK, Ward; Vervoort, I; Maex, KProceedings PaperC1
112000A novel non-destructive method for assessing the thermal resistance of power GaAs RF-MMIC amplifiersPETERSEN, Rainer; DE CEUNINCK, Ward; DE SCHEPPER, LucProceedings PaperC1