DE SCHEPPER, Luc

Email Alert RSS Feed

Profile

Full Name
DE SCHEPPER, Luc
Email
luc.deschepper@uhasselt.be
 
Loading... 5 0 5 0 false
Loading... 6 0 5 0 false

Publications

Results 21-40 of 89 (Search time: 0.014 seconds).

show all
Issue DateTitleContributor(s)TypeCat.
212002Statistical aspects of the degradation of LDD nMOSFETsANDRIES, Ellen; DREESEN, Raf; CROES, Kristof; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Groeseneken, G; Lo, KF; D'OLIESLAEGER, Marc; D'HAEN, JanJournal ContributionA1
222002Exploring the limits of Arrhenius-based life testing with heterojunction bipolar transistor technologyPETERSEN, Rainer; DE CEUNINCK, Ward; D'HAEN, Jan; D'OLIESLAEGER, Marc; DE SCHEPPER, Luc; Vendier, O; Blanck, HJournal ContributionA1
232001Study of UV and subgap photocurrent response in diamond and BCN thin films for detector applicationsNESLADEK, Milos; Vanecek, M; MEYKENS, Kristien; HAENEN, Ken; MANCA, Jean; DE SCHEPPER, Luc; Pace, E; Pini, A; Rinati, GV; Kimura, C; Etou, Y; Sugino, TJournal ContributionA1
42001Reversible switching of the surface conductance of hydrogenated CVD diamond filmsCannaerts, M; NESLADEK, Milos; HAENEN, Ken; STALS, Lambert; DE SCHEPPER, Luc; Van Haesendonck, CJournal ContributionA1
52001Origin of hydrogen-related surface conductivity in chemical vapor deposited diamond filmsCannaerts, M.; NESLADEK, Milos; HAENEN, Ken; DE SCHEPPER, Luc; Maslova, N.S.; van Haesendonck, C.Journal ContributionA3
62001Determination of the thermal resistance and current exponent of heterojunction bipolar transistors for reliability evaluationPETERSEN, Rainer; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Vendier, O; Blanck, H; Pons, DJournal ContributionA1
72001A new degradation model and lifetime extrapolation technique for lightly doped drain nMOSFETs under hot-carrier degradationDREESEN, Raf; CROES, Kristof; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Pergoot, A; Groeseneken, GJournal ContributionA1
82001High-resolution in-situ study of gold electromigration: test time reductionCROES, Kristof; DREESEN, Raf; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Tielemans, L; Van der Wel, PJournal ContributionA1
92000A novel non-destructive method for assessing the thermal resistance of power GaAs RF-MMIC amplifiersPETERSEN, Rainer; DE CEUNINCK, Ward; DE SCHEPPER, LucProceedings PaperC1
102000The stability of Pt heater and temperature sensing elements for silicon integrated tin oxide gas sensorsEsch, H; Huyberechts, G; Mertens, R.; Maes, Guido; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, LucJournal ContributionA1
112000A method to minimize test times for accelerated testing of pHEMT's by analysis of the elctronic fingerprint of the initial stage of degradationPETERSEN, Rainer; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Muraro, J.-L.Journal ContributionA1
122000Reliability aspects of high temperature power MOSFETsMANCA, Jean; Wondrak, W; Schaper, W; CROES, Kristof; D'HAEN, Jan; DE CEUNINCK, Ward; Dieval, B; Hartnagel, HL; D'OLIESLAEGER, Marc; DE SCHEPPER, LucJournal ContributionA1
132000In-situ SEM observation of electromigration in thin metal films at accelerated stress conditionsD'HAEN, Jan; VAN OLMEN, Jan; BEELEN, Zjef; MANCA, Jean; MARTENS, Tom; DE CEUNINCK, Ward; D'OLIESLAEGER, Marc; DE SCHEPPER, Luc; Cannaerts, M; Maex, KJournal ContributionA1
142000Investigation of the formation of sputtered oxide clusters with the Laser Assisted Sputtered Neutral Mass Spectroscopy technique (LASNMS)VLEKKEN, Johan; POLUS, Dany; D'OLIESLAEGER, Marc; Vandervorst, W.; DE SCHEPPER, LucProceedings PaperC2
152000Investigation of the formation process of MCs+-molecular ions during sputteringVLEKKEN, Johan; D'OLIESLAEGER, Marc; KNUYT, Gilbert; Vandervorst, W; DE SCHEPPER, LucJournal ContributionA1
161999The kinetics of the early stages of electromigration and concurrent temperature induced processes in thin film metallisations studied by means of an in-situ high resolution resistometric techniqueVAN OLMEN, Jan; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; D'Haeger, V; Witvrouw, A; Maex, K; Vandevelde, B; Beyne, E; Tielemans, LJournal Contribution
171999Modelling hot-carrier degradation of LDD NMOSFETs by using a high-resolution measurement technique.DREESEN, Raf; CROES, Kristof; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Pergoot, A; Groeseneken, GJournal Contribution
181999High electrical resistivity of CVD-diamondMANCA, Jean; NESLADEK, Milos; Neelen, M; QUAEYHAEGENS, Carl; DE SCHEPPER, Luc; DE CEUNINCK, WardJournal Contribution
191999Application of new PPV precursor polymers in organic LEDsKIEBOOMS, Rafael; Zojer, E.; Markart, P.; Resel, R.; DE SCHEPPER, Luc; VANDERZANDE, Dirk; GELAN, Jan; STALS, Lambert; Tasch, S.; Leising, G.Journal Contribution
201999Dynamics of electromigration induced void/hillock growth and precipitation/dissolution of addition elements studied by in-situ scanning electron microscopy resistance measurementsD'HAEN, Jan; COSEMANS, Patrick Peter; MANCA, Jean; LEKENS, Geert; MARTENS, Tom; DE CEUNINCK, Ward; D'OLIESLAEGER, Marc; DE SCHEPPER, Luc; Maex, KJournal Contribution
show all