DE SCHEPPER, Luc

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DE SCHEPPER, Luc
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luc.deschepper@uhasselt.be
 
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Publications

Results 41-60 of 89 (Search time: 0.006 seconds).

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Issue DateTitleContributor(s)TypeCat.
411999Application of new PPV precursor polymers in organic LEDsKIEBOOMS, Rafael; Zojer, E.; Markart, P.; Resel, R.; DE SCHEPPER, Luc; VANDERZANDE, Dirk; GELAN, Jan; STALS, Lambert; Tasch, S.; Leising, G.Journal Contribution
421998Monte Carlo simulation of the formation of M2+-molecular ions sputtered from metallic materialsVLEKKEN, Johan; WU, Ting-Di; D'OLIESLAEGER, Marc; KNUYT, Gilbert; DE SCHEPPER, Luc; Vandervorst, W.Proceedings Paper
431998Investigation of correlations between parameters defining the state of sputtered particlesVLEKKEN, Johan; CROES, Kristof; D'OLIESLAEGER, Marc; KNUYT, Gilbert; Vandervorst, W.; DE SCHEPPER, LucProceedings Paper
441998The dependence of stress induced voiding on line width studied by conventional and high resolution resistance measurementsWitvrouw, A; Maex, K; DE CEUNINCK, Ward; LEKENS, Geert; D'HAEN, Jan; DE SCHEPPER, LucJournal Contribution
451998The influence of addition elements on the early resistance changes observed during electromigration testing of Al metal linesDE CEUNINCK, Ward; D'Haeger, V; VAN OLMEN, Jan; Witvrouw, A; Maex, K; DE SCHEPPER, Luc; De Pauw, P; Pergoot, AJournal Contribution
461998Overview of the kinetics of the early stages of electromigration under low (= realistic) current density stressVAN OLMEN, Jan; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; D'Haeger, V; Witvrouw, A; Maex, KJournal Contribution
471998Analysis of the operating conditions of ETP electron multipliers used on Cameca IMS instrumentsWU, Ting-Di; VLEKKEN, Johan; D'OLIESLAEGER, Marc; DE SCHEPPER, LucProceedings Paper
481998Electrical characterization and reliability evaluation of capacitors by means of in situ leakage current measurementsMANCA, Jean; CROES, Kristof; DE SCHEPPER, Luc; DE CEUNINCK, Ward; STALS, Lambert; Jacques, L; Tielemans, L; Gerrits, N; Hoppener, RJournal Contribution
491998Study of Cu diffusion in an Al-1 wt%Si-0.5 wt%Cu bond pad with an Al-1 wt%Si bond wire attached using scanning electron microscopyCOSEMANS, Patrick; D'HAEN, Jan; Witvrouw, A; Proost, J; D'OLIESLAEGER, Marc; DE CEUNINCK, Ward; Maex, K; DE SCHEPPER, LucJournal Contribution
501998Bimodal failure behaviour of metal film resistorsCROES, Kristof; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Tielemans, LJournal Contribution
511998Quantitation of major elements with secondary ion mass spectrometry by using M-2(+)-molecular ionsVLEKKEN, Johan; WU, Ting-Di; D'OLIESLAEGER, Marc; KNUYT, Gilbert; Vandervorst, W; DE SCHEPPER, LucJournal Contribution
521998Localized monitoring of electromigration with early resistance change measurementsMANCA, Jean; CROES, Kristof; DE CEUNINCK, Ward; D'Haeger, V; D'HAEN, Jan; Depauw, P; Tielemans, L; DE SCHEPPER, LucJournal Contribution
531998Evaluation of the energy selection optics of Cameca IMS instruments using Fast Fourier Transforms (FFT)VLEKKEN, Johan; WU, Ting-Di; D'OLIESLAEGER, Marc; KNUYT, Gilbert; DE SCHEPPER, LucProceedings Paper
541998A new precursor to electroconducting conjugated polymers: Synthesis and opto-electrical properties of luminescent devices based on these PPV derivativesBijnens, W; Van Der Borght, M; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; VANDERZANDE, Dirk; STALS, Lambert; GELAN, JanJournal Contribution
551998Effect of oxygen on the electrical characteristics of PPV-LEDsMANCA, Jean; Bijnens, W; KIEBOOMS, Rafael; D'HAEN, Jan; D'OLIESLAEGER, Marc; WU, Ting-Di; DE CEUNINCK, Ward; DE SCHEPPER, Luc; VANDERZANDE, Dirk; GELAN, Jan; STALS, MarkJournal Contribution
561998Electrical field induced ageing of polymer light-emitting diodes in an oxygen-rich atmosphere studied by emission microscopy, scanning electron microscopy and secondary ion mass spectroscopyBijnens, W; De Wolf, I; MANCA, Jean; D'HAEN, Jan; WU, Ting-Di; D'OLIESLAEGER, Marc; Beyne, E; KIEBOOMS, Rafael; VANDERZANDE, Dirk; GELAN, Jan; DE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
571998The time of 'guessing' your failure time distribution is over!CROES, Kristof; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; MOLENBERGHS, GeertJournal Contribution
581997A high resolution method for measuring hot carrier degradation in matched transistor pairsDREESEN, Raf; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Groeseneken, G.Proceedings Paper
591997The thermally balanced bridge technique (TBBT): A new high resolution resistometric measurement technique for the study of electromigration-induced early resistance changes in metal stripesVAN OLMEN, Jan; DE CEUNINCK, Ward; DE SCHEPPER, Luc; GOLDONI, Alessandro; Cervini, A; Fantini, FJournal Contribution
601997In-situ study of the degradation behaviour of GaAs MESFETs for hi-rel applicationsPETERSEN, Rainer; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Gregoris, GJournal Contribution
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