DE SCHEPPER, Luc

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DE SCHEPPER, Luc
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luc.deschepper@uhasselt.be
 
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Publications

Results 67-89 of 89 (Search time: 0.006 seconds).

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Issue DateTitleContributor(s)TypeCat.
671996Study of the microstructure of IC interconnect metallisations using analytical transmission electron microscopy and secondary ion mass spectrometryCOSEMANS, Patrick Peter; D'OLIESLAEGER, Marc; DE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
681996Characterization of the early stages of electromigration in Al-based metal lines by means of a high resloution resistance monitoring technique based on an extremely stable ambient temperatureDE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, Lambert; d' Haeger, V.Proceedings Paper
691996A re-interpretation of the existence of a spectrum of activation energies for the microstructural changes in Al 1% Si linesStulens, Herwig; KNUYT, Gilbert; DE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
701996On the deposition and characterization of thin SnO2 filmsCZECH, I.; DE SCHEPPER, Luc; STALS, Lambert; Roggen, J.; Huyberechts, G.Proceedings Paper
711996Imaging of the ageing on organic electroluminescent diodes, under different atmospheres by impedance spectroscopy, scanning electron microscopy and SIMS depth profiling analysisBijnens, W; MANCA, Jean; WU, Ting-Di; D'OLIESLAEGER, Marc; VANDERZANDE, Dirk; GELAN, Jan; DE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
721995IN-SITU FAILURE-DETECTION IN THICK-FILM MULTILAYER SYSTEMSMANCA, Jean; DE SCHEPPER, Luc; DE CEUNINCK, Ward; D'OLIESLAEGER, Marc; STALS, LambertJournal Contribution
731995Evaluation on a two days time scale of high reliability electronic assemblies by in-situ electrical and optomechanical tests techniquesGregoris, G.; Bouton, F.; de Keukeleire, C.; Siliprandi, P.; Baio, F.; DE SCHEPPER, Luc; DE CEUNINCK, Ward; Tielemans, L.; Ahrens, T.; Krumm, M.Proceedings Paper
741995Thermal degradation of power modulesTielemans, L.; Gregoris, G.; DE SCHEPPER, Luc; D' OLIESLAEGER, MarcConference Material
751994Reliability study of on-chip interconnects - prediction of electromigration resistance on a short-time scaleDE CEUNINCK, Ward; D'Haeger, V; Stulens, Herwig; DE SCHEPPER, Luc; STALS, LambertProceedings Paper
761994The use of early resistance and early tcr changes to predict the reliability of on-chip interconnectsD'Haeger, V; Stulens, Herwig; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Tielemans, L; Gallopyn, G; Depauw P; STALS, LambertJournal Contribution
771994An activation-energy study of the microstructural changes in al-1-percent-si interconnectsStulens, Herwig; KNUYT, Gilbert; DE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
781993AN INTERFACE STUDY OF VARIOUS PVD TIN COATINGS ON PLASMA-NITRIDED AUSTENITIC STAINLESS-STEEL AISI 304D'HAEN, Jan; QUAEYHAEGENS, Carl; KNUYT, Gilbert; DE SCHEPPER, Luc; STALS, Lambert; VANSTAPPEN, MJournal Contribution
791993ELECTROMIGRATION - INVESTIGATION OF HETEROGENEOUS SYSTEMSVANHECKE, B; DE SCHEPPER, Luc; DE CEUNINCK, Ward; DHAEGER, V; D'OLIESLAEGER, Marc; BEYNE, E; ROGGEN, J; STALS, LambertJournal Contribution
801992THE INFLUENCE OF CURRENT STRESS ON THE AGING OF AU-ALL-PERCENT-SI(1-PERCENT-CU) BALL-BOND CONTACTS STUDIED BY SEM AND EDXD'OLIESLAEGER, Marc; DE SCHEPPER, Luc; DE CEUNINCK, Ward; STALS, LambertJournal Contribution
811991INTERFACE STUDY OF TIN-COATED AND TI-TIN-COATED STAINLESS-STEEL AISI-304 WITH ASYMMETRIC GLANCING ANGLE X-RAY-DIFFRACTION AND CLASSICAL BRAGG-BRENTANO X-RAY-DIFFRACTIONQUAEYHAEGENS, Carl; STALS, Lambert; DE SCHEPPER, Luc; VAN STAPPEN, MJournal Contribution
821991DETERMINATION OF THE ATTEMPT FREQUENCY FOR RELAXATION PHENOMENA IN AMORPHOUS METALSDE CEUNINCK, Ward; KNUYT, Gilbert; Stulens, Herwig; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
831991STABILITY OF HELIUM-FILLED PLATELETS IN NICKELD'OLIESLAEGER, Marc; KNUYT, Gilbert; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
841991CALCULATION OF SOME METALLIC-GLASS PROPERTIES, BASED ON THE USE OF A GAUSSIAN DISTRIBUTION FOR THE NEAREST-NEIGHBOR DISTANCE .2. DIFFUSION AND VISCOSITY PROPERTIESKNUYT, Gilbert; STALS, Lambert; DE SCHEPPER, LucJournal Contribution
851991ATOMISTIC COMPUTER-SIMULATION OF THE GROWTH OF HELIUM PLATELETS IN NICKELD'OLIESLAEGER, Marc; KNUYT, Gilbert; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
861991CALCULATION OF THE SHEAR MODULUS PROPERTIES OF AMORPHOUS-ALLOYSSTALS, Lambert; DE SCHEPPER, Luc; DE CEUNINCK, Ward; KNUYT, GilbertJournal Contribution
871991A NEW EXPLANATION FOR THE LINEAR INCREASE OF VISCOSITY WITH TIME IN AMORPHOUS-ALLOYSKNUYT, Gilbert; STALS, Lambert; DE SCHEPPER, Luc; DE CEUNINCK, WardJournal Contribution
881991CHARACTERIZATION OF TIN COATINGS DEPOSITED ON PLASMA NITRIDED TOOL STEEL SURFACESVANSTAPPEN, M; Malliet, B.; ROOS, JR; CELIS, JP; STALS, Lambert; DE SCHEPPER, LucJournal Contribution
891991CHARACTERIZATION BY GLANCING ANGLE X-RAY-DIFFRACTION OF THE INTERFACE BETWEEN AUSTENITIC STAINLESS-STEEL AISI-304 SUBSTRATES AND A TIN OR TI/TIN PHYSICAL VAPOR-DEPOSITION COATINGVANSTAPPEN, M; Malliet, B.; QUAEYHAEGENS, Carl; STALS, Lambert; DE SCHEPPER, LucJournal Contribution
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