DE CEUNINCK, Ward

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DE CEUNINCK, Ward
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ward.deceuninck@uhasselt.be
 
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Publications

Refined By:
Internal UHasselt:  D'HAEN, Jan
Type:  Journal Contribution

Results 1-17 of 17 (Search time: 0.004 seconds).

Issue DateTitleContributor(s)TypeCat.
12018Micro-patterned molecularly imprinted polymer structures on functionalized diamond-coated substrates for testosterone detectionKELLENS, Evelien; BOVE, Hannelore; VANDENRYT, Thijs; LAMBRICHTS, Jeroen; Dekens, Jolien; DRIJKONINGEN, Sien; D'HAEN, Jan; DE CEUNINCK, Ward; THOELEN, Ronald; JUNKERS, Tanja; HAENEN, Ken; ETHIRAJAN, AnithaJournal ContributionA1
22014Rapid fabrication of micron-sized CVD-diamond structures by microfluidic contact printingVANDENRYT, Thijs; GRIETEN, Lars; JANSSENS, Stoffel; VAN GRINSVEN, Bart; HAENEN, Ken; RUTTENS, Bart; D'HAEN, Jan; WAGNER, Patrick; THOELEN, Ronald; DE CEUNINCK, WardJournal ContributionA1
32008Increasing the mean grain size in copper films and featuresVANSTREELS, Kris; Brongersma, S.H.; Tokei, Zs.; Carbonell, L; DE CEUNINCK, Ward; D'HAEN, Jan; D'OLIESLAEGER, MarcJournal ContributionA1
42005A new method for the lifetime determination of submicron metal interconnects by means of a parallel test structureVANSTREELS, Kris; D'OLIESLAEGER, Marc; DE CEUNINCK, Ward; D'HAEN, Jan; Maex, KarenJournal ContributionA1
52004MTF test system with AC based dynamic joule correction for electromigration tests on interconnectsBIESEMANS, Leen; Schepers, K; VANSTREELS, Kris; D'HAEN, Jan; DE CEUNINCK, Ward; D'OLIESLAEGER, MarcJournal ContributionA1
62003A new method for the analysis of high-resolution SILC dataARESU, Stefano; DE CEUNINCK, Ward; KNUYT, Gilbert; MERTENS, Johan; MANCA, Jean; DE SCHEPPER, Luc; DEGRAEVE, Maria; Kaczer, B.; D'OLIESLAEGER, Marc; D'HAEN, JanJournal ContributionA1
72002Exploring the limits of Arrhenius-based life testing with heterojunction bipolar transistor technologyPETERSEN, Rainer; DE CEUNINCK, Ward; D'HAEN, Jan; D'OLIESLAEGER, Marc; DE SCHEPPER, Luc; Vendier, O; Blanck, HJournal ContributionA1
82002Statistical aspects of the degradation of LDD nMOSFETsANDRIES, Ellen; DREESEN, Raf; CROES, Kristof; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Groeseneken, G; Lo, KF; D'OLIESLAEGER, Marc; D'HAEN, JanJournal ContributionA1
92002High-resolution SILC measurements of thin SiO2 ultra low voltagesARESU, Stefano; DE CEUNINCK, Ward; DREESEN, Raf; CROES, Kristof; ANDRIES, Ellen; MANCA, Jean; DE SCHEPPER, Luc; DEGRAEVE, Maria; Kaczer, B.; D'OLIESLAEGER, Marc; D'HAEN, JanJournal ContributionA1
102000Reliability aspects of high temperature power MOSFETsMANCA, Jean; Wondrak, W; Schaper, W; CROES, Kristof; D'HAEN, Jan; DE CEUNINCK, Ward; Dieval, B; Hartnagel, HL; D'OLIESLAEGER, Marc; DE SCHEPPER, LucJournal ContributionA1
112000In-situ SEM observation of electromigration in thin metal films at accelerated stress conditionsD'HAEN, Jan; VAN OLMEN, Jan; BEELEN, Zjef; MANCA, Jean; MARTENS, Tom; DE CEUNINCK, Ward; D'OLIESLAEGER, Marc; DE SCHEPPER, Luc; Cannaerts, M; Maex, KJournal ContributionA1
121999Dynamics of electromigration induced void/hillock growth and precipitation/dissolution of addition elements studied by in-situ scanning electron microscopy resistance measurementsD'HAEN, Jan; COSEMANS, Patrick Peter; MANCA, Jean; LEKENS, Geert; MARTENS, Tom; DE CEUNINCK, Ward; D'OLIESLAEGER, Marc; DE SCHEPPER, Luc; Maex, KJournal Contribution
131998The dependence of stress induced voiding on line width studied by conventional and high resolution resistance measurementsWitvrouw, A; Maex, K; DE CEUNINCK, Ward; LEKENS, Geert; D'HAEN, Jan; DE SCHEPPER, LucJournal Contribution
141998Study of Cu diffusion in an Al-1 wt%Si-0.5 wt%Cu bond pad with an Al-1 wt%Si bond wire attached using scanning electron microscopyCOSEMANS, Patrick; D'HAEN, Jan; Witvrouw, A; Proost, J; D'OLIESLAEGER, Marc; DE CEUNINCK, Ward; Maex, K; DE SCHEPPER, LucJournal Contribution
151998Localized monitoring of electromigration with early resistance change measurementsMANCA, Jean; CROES, Kristof; DE CEUNINCK, Ward; D'Haeger, V; D'HAEN, Jan; Depauw, P; Tielemans, L; DE SCHEPPER, LucJournal Contribution
161998Effect of oxygen on the electrical characteristics of PPV-LEDsMANCA, Jean; Bijnens, W; KIEBOOMS, Rafael; D'HAEN, Jan; D'OLIESLAEGER, Marc; WU, Ting-Di; DE CEUNINCK, Ward; DE SCHEPPER, Luc; VANDERZANDE, Dirk; GELAN, Jan; STALS, MarkJournal Contribution
171998Electrical field induced ageing of polymer light-emitting diodes in an oxygen-rich atmosphere studied by emission microscopy, scanning electron microscopy and secondary ion mass spectroscopyBijnens, W; De Wolf, I; MANCA, Jean; D'HAEN, Jan; WU, Ting-Di; D'OLIESLAEGER, Marc; Beyne, E; KIEBOOMS, Rafael; VANDERZANDE, Dirk; GELAN, Jan; DE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, LambertJournal Contribution