DE CEUNINCK, Ward

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Full Name
DE CEUNINCK, Ward
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ward.deceuninck@uhasselt.be
 
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Publications

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Date Issued:  [1991 TO 1999]

Results 21-38 of 38 (Search time: 0.004 seconds).

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Issue DateTitleContributor(s)TypeCat.
211996A new technique to characterize the early stages of electromigration-induced resistance changes at low current densitiesDHaeger, V; DE CEUNINCK, Ward; KNUYT, Gilbert; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
221996Study of the microstructure of IC interconnect metallisations using analytical transmission electron microscopy and secondary ion mass spectrometryCOSEMANS, Patrick Peter; D'OLIESLAEGER, Marc; DE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
231996Characterization of the early stages of electromigration in Al-based metal lines by means of a high resloution resistance monitoring technique based on an extremely stable ambient temperatureDE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, Lambert; d' Haeger, V.Proceedings Paper
241996A re-interpretation of the existence of a spectrum of activation energies for the microstructural changes in Al 1% Si linesStulens, Herwig; KNUYT, Gilbert; DE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
251996Imaging of the ageing on organic electroluminescent diodes, under different atmospheres by impedance spectroscopy, scanning electron microscopy and SIMS depth profiling analysisBijnens, W; MANCA, Jean; WU, Ting-Di; D'OLIESLAEGER, Marc; VANDERZANDE, Dirk; GELAN, Jan; DE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
261995IN-SITU FAILURE-DETECTION IN THICK-FILM MULTILAYER SYSTEMSMANCA, Jean; DE SCHEPPER, Luc; DE CEUNINCK, Ward; D'OLIESLAEGER, Marc; STALS, LambertJournal Contribution
271995Evaluation on a two days time scale of high reliability electronic assemblies by in-situ electrical and optomechanical tests techniquesGregoris, G.; Bouton, F.; de Keukeleire, C.; Siliprandi, P.; Baio, F.; DE SCHEPPER, Luc; DE CEUNINCK, Ward; Tielemans, L.; Ahrens, T.; Krumm, M.Proceedings Paper
281994Reliability study of on-chip interconnects - prediction of electromigration resistance on a short-time scaleDE CEUNINCK, Ward; D'Haeger, V; Stulens, Herwig; DE SCHEPPER, Luc; STALS, LambertProceedings Paper
291994The use of early resistance and early tcr changes to predict the reliability of on-chip interconnectsD'Haeger, V; Stulens, Herwig; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Tielemans, L; Gallopyn, G; Depauw P; STALS, LambertJournal Contribution
301994An activation-energy study of the microstructural changes in al-1-percent-si interconnectsStulens, Herwig; KNUYT, Gilbert; DE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
311993DERIVATION OF AN ACTIVATION-ENERGY SPECTRUM FOR DEFECT PROCESSES FROM ISOTHERMAL MEASUREMENTS, USING A MINIMIZATION PRINCIPLE AND FOURIER-ANALYSISKNUYT, Gilbert; Stulens, Herwig; DE CEUNINCK, Ward; STALS, LambertJournal Contribution
321993ELECTROMIGRATION - INVESTIGATION OF HETEROGENEOUS SYSTEMSVANHECKE, B; DE SCHEPPER, Luc; DE CEUNINCK, Ward; DHAEGER, V; D'OLIESLAEGER, Marc; BEYNE, E; ROGGEN, J; STALS, LambertJournal Contribution
331992THE INFLUENCE OF CURRENT STRESS ON THE AGING OF AU-ALL-PERCENT-SI(1-PERCENT-CU) BALL-BOND CONTACTS STUDIED BY SEM AND EDXD'OLIESLAEGER, Marc; DE SCHEPPER, Luc; DE CEUNINCK, Ward; STALS, LambertJournal Contribution
341992A SIMPLE METHOD OF CALCULATING AN ENERGY-SPECTRUM FROM ISOTHERMAL MEASUREMENTS, USING FOURIER TECHNIQUESKNUYT, Gilbert; Stulens, Herwig; DE CEUNINCK, Ward; BEX, Geert Jan; STALS, LambertJournal Contribution
351992A SIMPLE METHOD FOR CALCULATING AN ENERGY-SPECTRUM FOR DEFECT ANNEALING FROM A CONSTANT HEATING RATE EXPERIMENTStulens, Herwig; KNUYT, Gilbert; DE CEUNINCK, Ward; STALS, LambertJournal Contribution
361991DETERMINATION OF THE ATTEMPT FREQUENCY FOR RELAXATION PHENOMENA IN AMORPHOUS METALSDE CEUNINCK, Ward; KNUYT, Gilbert; Stulens, Herwig; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
371991CALCULATION OF THE SHEAR MODULUS PROPERTIES OF AMORPHOUS-ALLOYSSTALS, Lambert; DE SCHEPPER, Luc; DE CEUNINCK, Ward; KNUYT, GilbertJournal Contribution
381991A NEW EXPLANATION FOR THE LINEAR INCREASE OF VISCOSITY WITH TIME IN AMORPHOUS-ALLOYSKNUYT, Gilbert; STALS, Lambert; DE SCHEPPER, Luc; DE CEUNINCK, WardJournal Contribution
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