KNUYT, Gilbert

Full Name
KNUYT, Gilbert
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Publications

Results 1-20 of 55 (Search time: 0.005 seconds).

Issue DateTitleContributor(s)TypeCat.
2812006Photoconductivity observations on phosphorous-doped n-type CVD diamond at low temperature and varying electric fieldKNUYT, Gilbert; HAENEN, Ken; NESLADEK, Milos; Stesmans, A.; Adriaenssens, GreetJournal ContributionA1
2822005The characteristics of photon and phonon standing waves in a periodic mediumKNUYT, Gilbert; NESLADEK, MilosJournal ContributionA1
2832005Understanding Oxide Degradation Mechanisms in ultra-thin SiO2 through High-Speed, High Resolution in-situ MeasurementsARESU, Stefano; DE CEUNINCK, Ward; Degraeve, R.; Kaczer, B.; KNUYT, Gilbert; DE SCHEPPER, LucJournal ContributionA1
2842004A model for the behaviour of tensile and compressive residual stresses developed in thin films produced by ion beam-assisted deposition techniquesKNUYT, GilbertJournal ContributionA1
2852003A new method for the analysis of high-resolution SILC dataARESU, Stefano; DE CEUNINCK, Ward; KNUYT, Gilbert; MERTENS, Johan; MANCA, Jean; DE SCHEPPER, Luc; DEGRAEVE, Maria; Kaczer, B.; D'OLIESLAEGER, Marc; D'HAEN, JanJournal ContributionA1
2862002ESR and photo-ESR study of defects in CVD diamondIakoubovskii, K; Stesmans, A; NESLADEK, Milos; KNUYT, GilbertJournal ContributionA1
2872001Phonon-assisted electronic transitions in phosphorus-doped n-type chemical vapor deposition diamond filmsHAENEN, Ken; MEYKENS, Kristien; NESLADEK, Milos; KNUYT, Gilbert; STALS, Lambert; Teraji, T; Koizumi, S; Gheeraert, EJournal ContributionA1
2882000A unified theoretical model for tensile and compressive residual film stressKNUYT, Gilbert; LAUWERENS, Walter; STALS, LambertJournal ContributionA1
2892000The electronic structure of phosphorus in n-type CVD diamond films: RevisedHAENEN, Ken; MEYKENS, Kristien; NESLADEK, Milos; KNUYT, Gilbert; STALS, Lambert; Teraji, T; Koizumi, SJournal ContributionA1
2902000Temperature dependent spectroscopic study of the electronic structure of phosphorus in n-type CVD diamond filmsHAENEN, Ken; MEYKENS, Kristien; NESLADEK, Milos; KNUYT, Gilbert; STALS, Lambert; Teraji, T; Koizumi, S; Gheeraert, EJournal ContributionA1
2912000Investigation of the formation process of MCs+-molecular ions during sputteringVLEKKEN, Johan; D'OLIESLAEGER, Marc; KNUYT, Gilbert; Vandervorst, W; DE SCHEPPER, LucJournal ContributionA1
2921999Modeling of nitride layer formation during plasma nitriding of ironDimitrov, VI; D'HAEN, Jan; KNUYT, Gilbert; QUAEYHAEGENS, Carl; STALS, LambertJournal Contribution
2931999Low temperature photoconductivity detection of phosphorus in diamondHAENEN, Ken; MEYKENS, Kristien; NESLADEK, Milos; KNUYT, Gilbert; QUAEYHAEGENS, Carl; STALS, Lambert; Koizumi, S; Gheeraert, EJournal Contribution
2941999Investigation of the formation of M-2(+)-molecular ions in sputtering processesVLEKKEN, Johan; CROES, Kristof; WU, Ting-Di; D'OLIESLAEGER, Marc; KNUYT, Gilbert; Vandervorst, W; DE SCHEPPER, LucJournal Contribution
2951998Generalized Wagner's diffusion model of surface modification of materials by plasma diffusion treatmentDimitrov, VI; KNUYT, Gilbert; STALS, Lambert; D'HAEN, Jan; QUAEYHAEGENS, CarlJournal Contribution
2961998On the behaviour of the penetration twin abundance on {100} diamond facetsKNUYT, Gilbert; NESLADEK, Milos; QUAEYHAEGENS, Carl; STALS, LambertJournal Contribution
2971998A method for determination of the effective diffusion coefficient and sputtering rate during plasma diffusion treatmentDimitrov, VI; D'HAEN, Jan; KNUYT, Gilbert; QUAEYHAEGENS, Carl; STALS, LambertJournal ContributionA1
2981998Quantitation of major elements with secondary ion mass spectrometry by using M-2(+)-molecular ionsVLEKKEN, Johan; WU, Ting-Di; D'OLIESLAEGER, Marc; KNUYT, Gilbert; Vandervorst, W; DE SCHEPPER, LucJournal Contribution
2991998New approach for the measurement of residual macroscopic stresses on highly preferentially oriented thin films using X-ray diffractionMEERT, Bart; QUAEYHAEGENS, Carl; KNUYT, Gilbert; JANSSEN, Herman; STALS, LambertProceedings Paper
3001998Investigation of correlations between parameters defining the state of sputtered particlesVLEKKEN, Johan; CROES, Kristof; D'OLIESLAEGER, Marc; KNUYT, Gilbert; Vandervorst, W.; DE SCHEPPER, LucProceedings Paper