DE SCHEPPER, Luc

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DE SCHEPPER, Luc
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luc.deschepper@uhasselt.be
 
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Author:  DE SCHEPPER, Luc

Results 21-40 of 89 (Search time: 0.012 seconds).

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Issue DateTitleContributor(s)TypeCat.
212002Influence of annealing on the electronic properties of chemical vapor deposited diamond films studied by high vacuum scanning tunneling microscopy and spectroscopyCannaerts, M; NESLADEK, Milos; HAENEN, Ken; DE SCHEPPER, Luc; STALS, Mark; Van Haesendonck, CJournal ContributionA1
222002High-resolution SILC measurements of thin SiO2 ultra low voltagesARESU, Stefano; DE CEUNINCK, Ward; DREESEN, Raf; CROES, Kristof; ANDRIES, Ellen; MANCA, Jean; DE SCHEPPER, Luc; DEGRAEVE, Maria; Kaczer, B.; D'OLIESLAEGER, Marc; D'HAEN, JanJournal ContributionA1
232001Study of UV and subgap photocurrent response in diamond and BCN thin films for detector applicationsNESLADEK, Milos; Vanecek, M; MEYKENS, Kristien; HAENEN, Ken; MANCA, Jean; DE SCHEPPER, Luc; Pace, E; Pini, A; Rinati, GV; Kimura, C; Etou, Y; Sugino, TJournal ContributionA1
242001Reversible switching of the surface conductance of hydrogenated CVD diamond filmsCannaerts, M; NESLADEK, Milos; HAENEN, Ken; STALS, Lambert; DE SCHEPPER, Luc; Van Haesendonck, CJournal ContributionA1
252001Origin of hydrogen-related surface conductivity in chemical vapor deposited diamond filmsCannaerts, M.; NESLADEK, Milos; HAENEN, Ken; DE SCHEPPER, Luc; Maslova, N.S.; van Haesendonck, C.Journal ContributionA3
262001Determination of the thermal resistance and current exponent of heterojunction bipolar transistors for reliability evaluationPETERSEN, Rainer; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Vendier, O; Blanck, H; Pons, DJournal ContributionA1
272001A new degradation model and lifetime extrapolation technique for lightly doped drain nMOSFETs under hot-carrier degradationDREESEN, Raf; CROES, Kristof; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Pergoot, A; Groeseneken, GJournal ContributionA1
282001High-resolution in-situ study of gold electromigration: test time reductionCROES, Kristof; DREESEN, Raf; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Tielemans, L; Van der Wel, PJournal ContributionA1
292000A novel non-destructive method for assessing the thermal resistance of power GaAs RF-MMIC amplifiersPETERSEN, Rainer; DE CEUNINCK, Ward; DE SCHEPPER, LucProceedings PaperC1
302000Reliability aspects of high temperature power MOSFETsMANCA, Jean; Wondrak, W; Schaper, W; CROES, Kristof; D'HAEN, Jan; DE CEUNINCK, Ward; Dieval, B; Hartnagel, HL; D'OLIESLAEGER, Marc; DE SCHEPPER, LucJournal ContributionA1
312000The stability of Pt heater and temperature sensing elements for silicon integrated tin oxide gas sensorsEsch, H; Huyberechts, G; Mertens, R.; Maes, Guido; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, LucJournal ContributionA1
322000Investigation of the formation process of MCs+-molecular ions during sputteringVLEKKEN, Johan; D'OLIESLAEGER, Marc; KNUYT, Gilbert; Vandervorst, W; DE SCHEPPER, LucJournal ContributionA1
332000Investigation of the formation of sputtered oxide clusters with the Laser Assisted Sputtered Neutral Mass Spectroscopy technique (LASNMS)VLEKKEN, Johan; POLUS, Dany; D'OLIESLAEGER, Marc; Vandervorst, W.; DE SCHEPPER, LucProceedings PaperC2
342000In-situ SEM observation of electromigration in thin metal films at accelerated stress conditionsD'HAEN, Jan; VAN OLMEN, Jan; BEELEN, Zjef; MANCA, Jean; MARTENS, Tom; DE CEUNINCK, Ward; D'OLIESLAEGER, Marc; DE SCHEPPER, Luc; Cannaerts, M; Maex, KJournal ContributionA1
352000A method to minimize test times for accelerated testing of pHEMT's by analysis of the elctronic fingerprint of the initial stage of degradationPETERSEN, Rainer; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Muraro, J.-L.Journal ContributionA1
361999The kinetics of the early stages of electromigration and concurrent temperature induced processes in thin film metallisations studied by means of an in-situ high resolution resistometric techniqueVAN OLMEN, Jan; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; D'Haeger, V; Witvrouw, A; Maex, K; Vandevelde, B; Beyne, E; Tielemans, LJournal Contribution
371999Dynamics of electromigration induced void/hillock growth and precipitation/dissolution of addition elements studied by in-situ scanning electron microscopy resistance measurementsD'HAEN, Jan; COSEMANS, Patrick Peter; MANCA, Jean; LEKENS, Geert; MARTENS, Tom; DE CEUNINCK, Ward; D'OLIESLAEGER, Marc; DE SCHEPPER, Luc; Maex, KJournal Contribution
381999Modelling hot-carrier degradation of LDD NMOSFETs by using a high-resolution measurement technique.DREESEN, Raf; CROES, Kristof; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Pergoot, A; Groeseneken, GJournal Contribution
391999Investigation of the formation of M-2(+)-molecular ions in sputtering processesVLEKKEN, Johan; CROES, Kristof; WU, Ting-Di; D'OLIESLAEGER, Marc; KNUYT, Gilbert; Vandervorst, W; DE SCHEPPER, LucJournal Contribution
401999High electrical resistivity of CVD-diamondMANCA, Jean; NESLADEK, Milos; Neelen, M; QUAEYHAEGENS, Carl; DE SCHEPPER, Luc; DE CEUNINCK, WardJournal Contribution
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