DE SCHEPPER, Luc

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DE SCHEPPER, Luc
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luc.deschepper@uhasselt.be
 
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Publications

Results 61-80 of 89 (Search time: 0.004 seconds).

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Issue DateTitleContributor(s)TypeCat.
611997In-situ study of the degradation behaviour of GaAs MESFETs for hi-rel applicationsPETERSEN, Rainer; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Gregoris, GJournal Contribution
621996A re-interpretation of the existence of a spectrum of activation energies for the microstructural changes in Al 1% Si linesStulens, Herwig; KNUYT, Gilbert; DE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
631996Imaging of the ageing on organic electroluminescent diodes, under different atmospheres by impedance spectroscopy, scanning electron microscopy and SIMS depth profiling analysisBijnens, W; MANCA, Jean; WU, Ting-Di; D'OLIESLAEGER, Marc; VANDERZANDE, Dirk; GELAN, Jan; DE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
241996Quantitative analysis of the compound layer of plasma nitrided pure ironD'HAEN, Jan; D'OLIESLAEGER, Marc; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
251996Characterization of the early stages of electromigration in Al-based metal lines by means of a high resloution resistance monitoring technique based on an extremely stable ambient temperatureDE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, Lambert; d' Haeger, V.Proceedings Paper
261996On the deposition and characterization of thin SnO2 filmsCZECH, I.; DE SCHEPPER, Luc; STALS, Lambert; Roggen, J.; Huyberechts, G.Proceedings Paper
271996Electrical characterisation and reliability studies of thick film gas sensor structures.CZECH, Jan; MANCA, Jean; Roggen J; Huyberechts G; STALS, Lambert; DE SCHEPPER, LucProceedings Paper
281996Study of the microstructure of IC interconnect metallisations using analytical transmission electron microscopy and secondary ion mass spectrometryCOSEMANS, Patrick Peter; D'OLIESLAEGER, Marc; DE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
291996Monte Carlo simulation of the formation of MCs(+) molecular ionsVLEKKEN, Johan; WU, Ting-Di; D'OLIESLAEGER, Marc; KNUYT, Gilbert; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
301996Evaluation on a two-day time scale of high-reliability electronic assemblies by in-situ electrical and opto-mechanical test techniquesGregoris, G.; Bouton, F.; DeKeukeleire, C.; Siliprandi, P.; Baio, F.; DE SCHEPPER, Luc; DE CEUNINCK, Ward; Tielemans, L.; Ahrens, T.; Krumm, M.Journal Contribution
311996A new technique to characterize the early stages of electromigration-induced resistance changes at low current densitiesDHaeger, V; DE CEUNINCK, Ward; KNUYT, Gilbert; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
321995Thermal degradation of power modulesTielemans, L.; Gregoris, G.; DE SCHEPPER, Luc; D' OLIESLAEGER, MarcConference Material
331995Evaluation on a two days time scale of high reliability electronic assemblies by in-situ electrical and optomechanical tests techniquesGregoris, G.; Bouton, F.; de Keukeleire, C.; Siliprandi, P.; Baio, F.; DE SCHEPPER, Luc; DE CEUNINCK, Ward; Tielemans, L.; Ahrens, T.; Krumm, M.Proceedings Paper
341995In-situ failure-detection in thick-film multilayer systemsMANCA, Jean; DE SCHEPPER, Luc; DE CEUNINCK, Ward; D'OLIESLAEGER, Marc; STALS, LambertJournal Contribution
351994An activation-energy study of the microstructural changes in al-1-percent-si interconnectsStulens, Herwig; KNUYT, Gilbert; DE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
361994Reliability study of on-chip interconnects - prediction of electromigration resistance on a short-time scaleDE CEUNINCK, Ward; D'Haeger, V; Stulens, Herwig; DE SCHEPPER, Luc; STALS, LambertProceedings Paper
371994The use of early resistance and early tcr changes to predict the reliability of on-chip interconnectsD'Haeger, V; Stulens, Herwig; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Tielemans, L; Gallopyn, G; Depauw P; STALS, LambertJournal Contribution
381993An interface study of various PVD TiN coatings on plasma-nitrided austenitic stainless-steel AISI 304D'HAEN, Jan; QUAEYHAEGENS, Carl; KNUYT, Gilbert; DE SCHEPPER, Luc; STALS, Lambert; VANSTAPPEN, MJournal Contribution
391993Electromigration - Investigation of heterogeneous systemsVANHECKE, B; DE SCHEPPER, Luc; DE CEUNINCK, Ward; DHAEGER, V; D'OLIESLAEGER, Marc; BEYNE, E; ROGGEN, J; STALS, LambertJournal Contribution
401992The influence of current stress on the aging of Au-all-percent-Si(1-percent-Cu) ball-bond contacts studied by SEM and EDXD'OLIESLAEGER, Marc; DE SCHEPPER, Luc; DE CEUNINCK, Ward; STALS, LambertJournal Contribution
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