DE SCHEPPER, Luc

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Full Name
DE SCHEPPER, Luc
Email
luc.deschepper@uhasselt.be
 
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Publications

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Date Issued:  [1991 TO 1999]
Internal UHasselt:  STALS, Lambert

Results 1-20 of 30 (Search time: 0.022 seconds).

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Issue DateTitleContributor(s)TypeCat.
11999Application of new PPV precursor polymers in organic LEDsKIEBOOMS, Rafael; Zojer, E.; Markart, P.; Resel, R.; DE SCHEPPER, Luc; VANDERZANDE, Dirk; GELAN, Jan; STALS, Lambert; Tasch, S.; Leising, G.Journal Contribution
21998Electrical characterization and reliability evaluation of capacitors by means of in situ leakage current measurementsMANCA, Jean; CROES, Kristof; DE SCHEPPER, Luc; DE CEUNINCK, Ward; STALS, Lambert; Jacques, L; Tielemans, L; Gerrits, N; Hoppener, RJournal Contribution
31998A new precursor to electroconducting conjugated polymers: Synthesis and opto-electrical properties of luminescent devices based on these PPV derivativesBijnens, W; Van Der Borght, M; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; VANDERZANDE, Dirk; STALS, Lambert; GELAN, JanJournal Contribution
41998Electrical field induced ageing of polymer light-emitting diodes in an oxygen-rich atmosphere studied by emission microscopy, scanning electron microscopy and secondary ion mass spectroscopyBijnens, W; De Wolf, I; MANCA, Jean; D'HAEN, Jan; WU, Ting-Di; D'OLIESLAEGER, Marc; Beyne, E; KIEBOOMS, Rafael; VANDERZANDE, Dirk; GELAN, Jan; DE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
51997Design of a new test structure for the study of electromigration with early resistance change measurementsDE CEUNINCK, Ward; MANCA, Jean; D'Haeger, V; VAN OLMEN, Jan; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
61996Electrical characterisation and reliability studies of thick film gas sensor structures.CZECH, Jan; MANCA, Jean; Roggen J; Huyberechts G; STALS, Lambert; DE SCHEPPER, LucProceedings Paper
71996A new technique to characterize the early stages of electromigration-induced resistance changes at low current densitiesDHaeger, V; DE CEUNINCK, Ward; KNUYT, Gilbert; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
81996Quantitative analysis of the compound layer of plasma nitrided pure ironD'HAEN, Jan; D'OLIESLAEGER, Marc; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
91996Monte Carlo simulation of the formation of MCs(+) molecular ionsVLEKKEN, Johan; WU, Ting-Di; D'OLIESLAEGER, Marc; KNUYT, Gilbert; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
101996Study of the microstructure of IC interconnect metallisations using analytical transmission electron microscopy and secondary ion mass spectrometryCOSEMANS, Patrick Peter; D'OLIESLAEGER, Marc; DE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
111996Characterization of the early stages of electromigration in Al-based metal lines by means of a high resloution resistance monitoring technique based on an extremely stable ambient temperatureDE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, Lambert; d' Haeger, V.Proceedings Paper
121996A re-interpretation of the existence of a spectrum of activation energies for the microstructural changes in Al 1% Si linesStulens, Herwig; KNUYT, Gilbert; DE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
131996On the deposition and characterization of thin SnO2 filmsCZECH, I.; DE SCHEPPER, Luc; STALS, Lambert; Roggen, J.; Huyberechts, G.Proceedings Paper
141996Imaging of the ageing on organic electroluminescent diodes, under different atmospheres by impedance spectroscopy, scanning electron microscopy and SIMS depth profiling analysisBijnens, W; MANCA, Jean; WU, Ting-Di; D'OLIESLAEGER, Marc; VANDERZANDE, Dirk; GELAN, Jan; DE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
151995IN-SITU FAILURE-DETECTION IN THICK-FILM MULTILAYER SYSTEMSMANCA, Jean; DE SCHEPPER, Luc; DE CEUNINCK, Ward; D'OLIESLAEGER, Marc; STALS, LambertJournal Contribution
161994Reliability study of on-chip interconnects - prediction of electromigration resistance on a short-time scaleDE CEUNINCK, Ward; D'Haeger, V; Stulens, Herwig; DE SCHEPPER, Luc; STALS, LambertProceedings Paper
171994The use of early resistance and early tcr changes to predict the reliability of on-chip interconnectsD'Haeger, V; Stulens, Herwig; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Tielemans, L; Gallopyn, G; Depauw P; STALS, LambertJournal Contribution
181994An activation-energy study of the microstructural changes in al-1-percent-si interconnectsStulens, Herwig; KNUYT, Gilbert; DE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
191993AN INTERFACE STUDY OF VARIOUS PVD TIN COATINGS ON PLASMA-NITRIDED AUSTENITIC STAINLESS-STEEL AISI 304D'HAEN, Jan; QUAEYHAEGENS, Carl; KNUYT, Gilbert; DE SCHEPPER, Luc; STALS, Lambert; VANSTAPPEN, MJournal Contribution
201993ELECTROMIGRATION - INVESTIGATION OF HETEROGENEOUS SYSTEMSVANHECKE, B; DE SCHEPPER, Luc; DE CEUNINCK, Ward; DHAEGER, V; D'OLIESLAEGER, Marc; BEYNE, E; ROGGEN, J; STALS, LambertJournal Contribution
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