DE CEUNINCK, Ward

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DE CEUNINCK, Ward
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ward.deceuninck@uhasselt.be
 
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Publications

Results 41-60 of 114 (Search time: 0.005 seconds).

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Issue DateTitleContributor(s)TypeCat.
412011Rapid assessment of the stability of DNA duplexes by impedimetric real-time monitoring of chemically induced denaturationVAN GRINSVEN, Bart; VANDEN BON, Natalie; GRIETEN, Lars; MURIB, Mohammed Sharif; JANSSENS, Stoffel; HAENEN, Ken; Schneider, E.; Ingebrandt, S.; Schöning, M.J.; VERMEEREN, Veronique; AMELOOT, Marcel; MICHIELS, Luc; THOELEN, Ronald; DE CEUNINCK, Ward; WAGNER, PatrickJournal ContributionA1
1022010Apparent and steady-state etch rates in thin film etching and under-etching of microstructures: II. CharacterizationVAN BAREL, Gregory; Du Bois, Bert; Van Hoof, Rita; De Wachter, Jef; DE CEUNINCK, Ward; Witvrouw, AnnJournal ContributionA1
1032010Apparent and steady-state etch rates in thin film etching and under-etching of microstructures: I. ModellingVAN BAREL, Gregory; Mertens, Luc; DE CEUNINCK, Ward; Witvrouw, AnnJournal ContributionA1
1042010Customized impedance spectroscopy device as possible sensor platform for biosensor applicationsVAN GRINSVEN, Bart; VANDENRYT, Thijs; DUCHATEAU, Stijn; GAULKE, Andreas; GRIETEN, Lars; THOELEN, Ronald; Ingebrandt, Sven; DE CEUNINCK, Ward; WAGNER, PatrickJournal ContributionA1
1052008The influence of different surface terminations on electrical transport and emission properties for freestanding single crystalline (100) CVD diamond samplesDEFERME, Wim; BOGDAN, Anna; HAENEN, Ken; DE CEUNINCK, Ward; Flipse, K.; NESLADEK, MilosProceedings PaperC1
1062008Increasing the mean grain size in copper films and featuresVANSTREELS, Kris; Brongersma, S.H.; Tokei, Zs.; Carbonell, L; DE CEUNINCK, Ward; D'HAEN, Jan; D'OLIESLAEGER, MarcJournal ContributionA1
1072008The influence of geometrical imperfections in micromachined cantilevers on the extracted Young's modulus using a simple modelVAN BAREL, Gregory; DE CEUNINCK, Ward; Witvrouw, AnnJournal ContributionA1
1082007High sputter bias super secondary grain growth initiation (In structures)VANSTREELS, Kris; BRONGERSMA, Sywert; D'HAEN, Jan; DEMUYNCK, Steven; DE CEUNINCK, Ward; CALUWAERTS, Rudi; D'OLIESLAEGER, MarcProceedings PaperC1
1092007Electrical transport measurements and emission properties of freestanding single crystalline CVD diamond samplesDEFERME, Wim; BOGDAN, Anna; BOGDAN, Andrey; HAENEN, Ken; DE CEUNINCK, Ward; NESLADEK, MilosJournal ContributionA1
102007Microstructural evolution of cu interconnect under AC, pulsed DC and DC current stressBIESEMANS, Leen; VANSTREELS, Kris; BRONGERSMA, Sywert; D'HAEN, Jan; DE CEUNINCK, Ward; D'OLIESLAEGER, MarcProceedings PaperC1
112007Lifetime modeling of intrinsic gate oxide breakdown at high temperatureMOONEN, Rob; Vanmeerbeek, P; LEKENS, Geert; DE CEUNINCK, Ward; Moens, P.; BOUTSEN, JanJournal ContributionA1
722007Study of time-dependent dielectric breakdown on gate oxide capacitors at high temperatureMOONEN, Rob; Vanmeerbeek, P; LEKENS, Geert; DE CEUNINCK, Ward; Moens, P.; Boutsen, J.Proceedings PaperC1
732007Electrical transport and defect spectroscopy of free standing single crystal CVD diamond prepared from methane rich mixturesBOGDAN, Andrey; BOGDAN, Anna; DE CEUNINCK, Ward; HAENEN, Ken; NESLADEK, MilosProceedings PaperC1
742006Super secondary grain growth initiation in electroplated copperVANSTREELS, Kris; Brongersma, SH; Demuynck, S; Carbonell, L; D'HAEN, Jan; DE CEUNINCK, Ward; D'OLIESLAEGER, Marc; Maex, KProceedings PaperC1
752005A new method for the lifetime determination of submicron metal interconnects by means of a parallel test structureVANSTREELS, Kris; D'OLIESLAEGER, Marc; DE CEUNINCK, Ward; D'HAEN, Jan; Maex, KarenJournal ContributionA1
762005Understanding Oxide Degradation Mechanisms in ultra-thin SiO2 through High-Speed, High Resolution in-situ MeasurementsARESU, Stefano; DE CEUNINCK, Ward; Degraeve, R.; Kaczer, B.; KNUYT, Gilbert; DE SCHEPPER, LucJournal ContributionA1
772004MTF test system with AC based dynamic joule correction for electromigration tests on interconnectsBIESEMANS, Leen; Schepers, K; VANSTREELS, Kris; D'HAEN, Jan; DE CEUNINCK, Ward; D'OLIESLAEGER, MarcJournal ContributionA1
782004A new method for the lifetime determination of submicron metal interconnects by means of a parallel test structureVANSTREELS, Kris; D'OLIESLAEGER, Marc; DE CEUNINCK, Ward; D'HAEN, Jan; Maex, KarenProceedings PaperC1
792004Evidence for source side injection hot carrier effects on lateral DMOS transistorsARESU, Stefano; DE CEUNINCK, Ward; Van den Bosch, G; Groeseneken, G; Moens, P.; MANCA, Jean; Wojciechowski, D; Gassot, PJournal ContributionA1
802003A new method for the analysis of high-resolution SILC dataARESU, Stefano; DE CEUNINCK, Ward; KNUYT, Gilbert; MERTENS, Johan; MANCA, Jean; DE SCHEPPER, Luc; DEGRAEVE, Maria; Kaczer, B.; D'OLIESLAEGER, Marc; D'HAEN, JanJournal ContributionA1
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