DE CEUNINCK, Ward

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DE CEUNINCK, Ward
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ward.deceuninck@uhasselt.be
 
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Publications

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Type:  Journal Contribution

Results 41-60 of 97 (Search time: 0.006 seconds).

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Issue DateTitleContributor(s)TypeCat.
412010Customized impedance spectroscopy device as possible sensor platform for biosensor applicationsVAN GRINSVEN, Bart; VANDENRYT, Thijs; DUCHATEAU, Stijn; GAULKE, Andreas; GRIETEN, Lars; THOELEN, Ronald; Ingebrandt, Sven; DE CEUNINCK, Ward; WAGNER, PatrickJournal ContributionA1
422008The influence of geometrical imperfections in micromachined cantilevers on the extracted Young's modulus using a simple modelVAN BAREL, Gregory; DE CEUNINCK, Ward; Witvrouw, AnnJournal ContributionA1
432008Increasing the mean grain size in copper films and featuresVANSTREELS, Kris; Brongersma, S.H.; Tokei, Zs.; Carbonell, L; DE CEUNINCK, Ward; D'HAEN, Jan; D'OLIESLAEGER, MarcJournal ContributionA1
442007Electrical transport measurements and emission properties of freestanding single crystalline CVD diamond samplesDEFERME, Wim; BOGDAN, Anna; BOGDAN, Andrey; HAENEN, Ken; DE CEUNINCK, Ward; NESLADEK, MilosJournal ContributionA1
452007Lifetime modeling of intrinsic gate oxide breakdown at high temperatureMOONEN, Rob; Vanmeerbeek, P; LEKENS, Geert; DE CEUNINCK, Ward; Moens, P.; BOUTSEN, JanJournal ContributionA1
462005A new method for the lifetime determination of submicron metal interconnects by means of a parallel test structureVANSTREELS, Kris; D'OLIESLAEGER, Marc; DE CEUNINCK, Ward; D'HAEN, Jan; Maex, KarenJournal ContributionA1
472005Understanding Oxide Degradation Mechanisms in ultra-thin SiO2 through High-Speed, High Resolution in-situ MeasurementsARESU, Stefano; DE CEUNINCK, Ward; Degraeve, R.; Kaczer, B.; KNUYT, Gilbert; DE SCHEPPER, LucJournal ContributionA1
482004MTF test system with AC based dynamic joule correction for electromigration tests on interconnectsBIESEMANS, Leen; Schepers, K; VANSTREELS, Kris; D'HAEN, Jan; DE CEUNINCK, Ward; D'OLIESLAEGER, MarcJournal ContributionA1
492004Evidence for source side injection hot carrier effects on lateral DMOS transistorsARESU, Stefano; DE CEUNINCK, Ward; Van den Bosch, G; Groeseneken, G; Moens, P.; MANCA, Jean; Wojciechowski, D; Gassot, PJournal ContributionA1
502003Advantage of In-situ over Ex-situ techniques as reliability tool: Aging kinetics of Imec's MCM-D discrete passives devices.Soussan, P; LEKENS, Geert; DREESEN, Raf; DE CEUNINCK, Ward; Beyne, EJournal ContributionA1
512003A new method for the analysis of high-resolution SILC dataARESU, Stefano; DE CEUNINCK, Ward; KNUYT, Gilbert; MERTENS, Johan; MANCA, Jean; DE SCHEPPER, Luc; DEGRAEVE, Maria; Kaczer, B.; D'OLIESLAEGER, Marc; D'HAEN, JanJournal ContributionA1
522002How reliable are reliability tests?Tielemans, L; Rongen, R; DE CEUNINCK, WardJournal ContributionA1
532002Exploring the limits of Arrhenius-based life testing with heterojunction bipolar transistor technologyPETERSEN, Rainer; DE CEUNINCK, Ward; D'HAEN, Jan; D'OLIESLAEGER, Marc; DE SCHEPPER, Luc; Vendier, O; Blanck, HJournal ContributionA1
542002Statistical aspects of the degradation of LDD nMOSFETsANDRIES, Ellen; DREESEN, Raf; CROES, Kristof; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Groeseneken, G; Lo, KF; D'OLIESLAEGER, Marc; D'HAEN, JanJournal ContributionA1
552002A comparison between state-of-the-art 'gilch' and 'sulphinyl' synthesised MDMO-PPV/PCBM bulk hetero-junction solar cellsMUNTERS, Tom; MARTENS, Tom; GORIS, Ludwig; VRINDTS, Veerle; MANCA, Jean; LUTSEN, Laurence; DE CEUNINCK, Ward; VANDERZANDE, Dirk; DE SCHEPPER, Luc; GELAN, Jan; Sariciftci, NS; Brabec, CJJournal ContributionA1
562002High-resolution SILC measurements of thin SiO2 ultra low voltagesARESU, Stefano; DE CEUNINCK, Ward; DREESEN, Raf; CROES, Kristof; ANDRIES, Ellen; MANCA, Jean; DE SCHEPPER, Luc; DEGRAEVE, Maria; Kaczer, B.; D'OLIESLAEGER, Marc; D'HAEN, JanJournal ContributionA1
572001Determination of the thermal resistance and current exponent of heterojunction bipolar transistors for reliability evaluationPETERSEN, Rainer; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Vendier, O; Blanck, H; Pons, DJournal ContributionA1
582001A new degradation model and lifetime extrapolation technique for lightly doped drain nMOSFETs under hot-carrier degradationDREESEN, Raf; CROES, Kristof; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Pergoot, A; Groeseneken, GJournal ContributionA1
592001High-resolution in-situ study of gold electromigration: test time reductionCROES, Kristof; DREESEN, Raf; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Tielemans, L; Van der Wel, PJournal ContributionA1
602000Reliability aspects of high temperature power MOSFETsMANCA, Jean; Wondrak, W; Schaper, W; CROES, Kristof; D'HAEN, Jan; DE CEUNINCK, Ward; Dieval, B; Hartnagel, HL; D'OLIESLAEGER, Marc; DE SCHEPPER, LucJournal ContributionA1
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