CROES, Kristof

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Full Name
CROES, Kristof
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kristof.croes@uhasselt.be
 
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Publications

Results 1-18 of 18 (Search time: 0.008 seconds).

Issue DateTitleContributor(s)TypeCat.
12015Endocrine actions of pesticides measured in the Flemish environment and health studies (FLEHS I and II)CROES, Kristof; Den Hond, E.; BRUCKERS, Liesbeth; Govarts, E.; Schoeters, G.; Covaci, A.; Loots, I.; Morrens, B.; Nelen, V.; Sioen, I.; Van Larebeke, N.; Baeyens, W.Journal ContributionA1
22013Neurobehavioral Function and low-level Exposure to Brominated Flame Retardants in Adolescents: a cross-sectional StudyKICINSKI, Michal; Viaene, M.; Den Hond, E.; Schoeters, G.; Covaci, A.; Dirtu, A.; Nelen, V.; BRUCKERS, Liesbeth; CROES, Kristof; Van Larebeke, N.; NAWROT, TimConference MaterialC2
32013Determination of PCDD/Fs, PBDD/Fs and dioxin-like PCBs in human milk from mothers residing in the rural areas in Flanders, using the CALUX bioassay and GC-HRMSCROES, Kristof; Colles, A.; Koppen, G.; De Galan, S.; Vandermarken, T.; Govarts, E.; BRUCKERS, Liesbeth; Nelen, V.; Schoeters, G.; Van Larebeke, N.; Denison, M. S.; Mampaey, M.; Baeyens, W.Journal ContributionA1
42008Variability of polymorphic families of three types of xylanase inhibitors in the wheat grain proteomeCourtin, CM; CROES, Kristof; Gebruers, K.; ROBBEN, Johan; NOBEN, Jean-Paul; Samyn, B.; Debyser, G.; Van Beeumen, J.; Delcour, CMJournal ContributionA1
52003Moisture induced failures in flip chip on flex interconnections using anisotropic conductive adhesivesLEKENS, Geert; DREESEN, Raf; CROES, Kristof; Caers, J.F.J.M.; Zhao, X.J.; Wong, E.H.Proceedings PaperC2
62002Statistical aspects of the degradation of LDD nMOSFETsANDRIES, Ellen; DREESEN, Raf; CROES, Kristof; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Groeseneken, G; Lo, KF; D'OLIESLAEGER, Marc; D'HAEN, JanJournal ContributionA1
72002High-resolution SILC measurements of thin SiO2 ultra low voltagesARESU, Stefano; DE CEUNINCK, Ward; DREESEN, Raf; CROES, Kristof; ANDRIES, Ellen; MANCA, Jean; DE SCHEPPER, Luc; DEGRAEVE, Maria; Kaczer, B.; D'OLIESLAEGER, Marc; D'HAEN, JanJournal ContributionA1
82001A new degradation model and lifetime extrapolation technique for lightly doped drain nMOSFETs under hot-carrier degradationDREESEN, Raf; CROES, Kristof; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Pergoot, A; Groeseneken, GJournal ContributionA1
92001High-resolution in-situ study of gold electromigration: test time reductionCROES, Kristof; DREESEN, Raf; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Tielemans, L; Van der Wel, PJournal ContributionA1
102000Reliability aspects of high temperature power MOSFETsMANCA, Jean; Wondrak, W; Schaper, W; CROES, Kristof; D'HAEN, Jan; DE CEUNINCK, Ward; Dieval, B; Hartnagel, HL; D'OLIESLAEGER, Marc; DE SCHEPPER, LucJournal ContributionA1
111999Statistical techniques for planning type I singly censored reliability experiments with two stress factorsCROES, KristofTheses and DissertationsT1
121999Modelling hot-carrier degradation of LDD NMOSFETs by using a high-resolution measurement technique.DREESEN, Raf; CROES, Kristof; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Pergoot, A; Groeseneken, GJournal Contribution
131999Investigation of the formation of M-2(+)-molecular ions in sputtering processesVLEKKEN, Johan; CROES, Kristof; WU, Ting-Di; D'OLIESLAEGER, Marc; KNUYT, Gilbert; Vandervorst, W; DE SCHEPPER, LucJournal Contribution
141998Investigation of correlations between parameters defining the state of sputtered particlesVLEKKEN, Johan; CROES, Kristof; D'OLIESLAEGER, Marc; KNUYT, Gilbert; Vandervorst, W.; DE SCHEPPER, LucProceedings Paper
151998Electrical characterization and reliability evaluation of capacitors by means of in situ leakage current measurementsMANCA, Jean; CROES, Kristof; DE SCHEPPER, Luc; DE CEUNINCK, Ward; STALS, Lambert; Jacques, L; Tielemans, L; Gerrits, N; Hoppener, RJournal Contribution
161998Bimodal failure behaviour of metal film resistorsCROES, Kristof; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Tielemans, LJournal Contribution
171998Localized monitoring of electromigration with early resistance change measurementsMANCA, Jean; CROES, Kristof; DE CEUNINCK, Ward; D'Haeger, V; D'HAEN, Jan; Depauw, P; Tielemans, L; DE SCHEPPER, LucJournal Contribution
181998The time of 'guessing' your failure time distribution is over!CROES, Kristof; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; MOLENBERGHS, GeertJournal Contribution