DE SCHEPPER, Luc

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DE SCHEPPER, Luc
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luc.deschepper@uhasselt.be
 
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Author:  DE SCHEPPER, Luc
Type:  Proceedings Paper

Results 1-18 of 18 (Search time: 0.01 seconds).

Issue DateTitleContributor(s)TypeCat.
12004Low-level optical absorption phenomena in organic thin films for solar cell applications investigated by high sensitive photocurrent and photothermal techniquesGORIS, Ludwig; HAENEN, Ken; NESLADEK, Milos; Poruba, A.; Vanecek, M.; WAGNER, Patrick; LUTSEN, Laurence; MANCA, Jean; VANDERZANDE, Dirk; DE SCHEPPER, LucProceedings PaperC1
22003Application of general finite mixture models to reliability data using likelihood estimationANDRIES, Ellen; CROES, Kristof; DE SCHEPPER, Luc; MOLENBERGHS, GeertProceedings PaperC2
32003In-situ electrical and spectroscopical techniques for the study of degradation mechanisms and life time prediction of organic based electronic material systemsMANCA, Jean; GORIS, Ludwig; KESTERS, Els; LUTSEN, Laurence; MARTENS, Tom; HAENEN, Ken; NESLADEK, Milos; SANNA, Ornella; VANDERZANDE, Dirk; D'HAEN, Jan; DE SCHEPPER, LucProceedings PaperC1
42003In-situ electrical and spectroscopical techniques for the study of degradation mechanisms and life time prediction of organic based electronic material systemsMANCA, Jean; GORIS, Ludwig; KESTERS, Els; LUTSEN, Laurence; MARTENS, Tom; HAENEN, Ken; NESLADEK, Milos; VANDERZANDE, Dirk; D'HAEN, Jan; DE SCHEPPER, Luc; SANNA, OrnellaProceedings PaperC1
52003Morphology of MDMO-PPV: PCBM bulk hetero-junction organic solar cells studied by AFM, KFM and TEMMARTENS, Tom; BEELEN, Zjef; D'HAEN, Jan; MUNTERS, Tom; GORIS, Ludwig; MANCA, Jean; D'OLIESLAEGER, Marc; VANDERZANDE, Dirk; DE SCHEPPER, Luc; Andriessen, RonnProceedings PaperC1
62002The influence of the microstructure upon the photovoltaic performance of MDMO-PPV:PCBM bulk hetero-junction organic solar cellsMARTENS, Tom; D'HAEN, Jan; MUNTERS, Tom; GORIS, Ludwig; BEELEN, Zjef; MANCA, Jean; D'OLIESLAEGER, Marc; VANDERZANDE, Dirk; DE SCHEPPER, Luc; Andriessen, RonnProceedings PaperC1
72000A novel non-destructive method for assessing the thermal resistance of power GaAs RF-MMIC amplifiersPETERSEN, Rainer; DE CEUNINCK, Ward; DE SCHEPPER, LucProceedings PaperC1
82000Investigation of the formation of sputtered oxide clusters with the Laser Assisted Sputtered Neutral Mass Spectroscopy technique (LASNMS)VLEKKEN, Johan; POLUS, Dany; D'OLIESLAEGER, Marc; Vandervorst, W.; DE SCHEPPER, LucProceedings PaperC2
91998Monte Carlo simulation of the formation of M2+-molecular ions sputtered from metallic materialsVLEKKEN, Johan; WU, Ting-Di; D'OLIESLAEGER, Marc; KNUYT, Gilbert; DE SCHEPPER, Luc; Vandervorst, W.Proceedings Paper
101998Investigation of correlations between parameters defining the state of sputtered particlesVLEKKEN, Johan; CROES, Kristof; D'OLIESLAEGER, Marc; KNUYT, Gilbert; Vandervorst, W.; DE SCHEPPER, LucProceedings Paper
111998Analysis of the operating conditions of ETP electron multipliers used on Cameca IMS instrumentsWU, Ting-Di; VLEKKEN, Johan; D'OLIESLAEGER, Marc; DE SCHEPPER, LucProceedings Paper
121998Evaluation of the energy selection optics of Cameca IMS instruments using Fast Fourier Transforms (FFT)VLEKKEN, Johan; WU, Ting-Di; D'OLIESLAEGER, Marc; KNUYT, Gilbert; DE SCHEPPER, LucProceedings Paper
131997A high resolution method for measuring hot carrier degradation in matched transistor pairsDREESEN, Raf; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Groeseneken, G.Proceedings Paper
141996Electrical characterisation and reliability studies of thick film gas sensor structures.CZECH, Jan; MANCA, Jean; Roggen J; Huyberechts G; STALS, Lambert; DE SCHEPPER, LucProceedings Paper
151996Characterization of the early stages of electromigration in Al-based metal lines by means of a high resloution resistance monitoring technique based on an extremely stable ambient temperatureDE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, Lambert; d' Haeger, V.Proceedings Paper
161996On the deposition and characterization of thin SnO2 filmsCZECH, I.; DE SCHEPPER, Luc; STALS, Lambert; Roggen, J.; Huyberechts, G.Proceedings Paper
171995Evaluation on a two days time scale of high reliability electronic assemblies by in-situ electrical and optomechanical tests techniquesGregoris, G.; Bouton, F.; de Keukeleire, C.; Siliprandi, P.; Baio, F.; DE SCHEPPER, Luc; DE CEUNINCK, Ward; Tielemans, L.; Ahrens, T.; Krumm, M.Proceedings Paper
181994Reliability study of on-chip interconnects - prediction of electromigration resistance on a short-time scaleDE CEUNINCK, Ward; D'Haeger, V; Stulens, Herwig; DE SCHEPPER, Luc; STALS, LambertProceedings Paper