DE SCHEPPER, Luc

Full Name
DE SCHEPPER, Luc
Email
luc.deschepper@uhasselt.be
 
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Publications

Results 1-54 of 89 (Search time: 0.002 seconds).

Issue DateTitleContributor(s)TypeCat.
12018Een nieuw oriënteringsinstrument – met hoge correlatie met reëel studiesucces – voor de begeleiding van de studiekeuze naar de universiteit toeNAUWELAERTS, Erna; DOUMEN, Sarah; VERHAERT, Guido; MOLENBERGHS, Geert; DE SCHEPPER, LucJournal ContributionA1
22014Effectiviteit van toelatingsproevenNAUWELAERTS, Erna; DOUMEN, Sarah; DE SCHEPPER, LucJournal ContributionA1
32006Observation of the subgap optical absorption in polymer-fullerene blend solar cellsGORIS, Ludwig; Poruba, A.; Hod'akova, L.; Vanecek, M.; HAENEN, Ken; NESLADEK, Milos; WAGNER, Patrick; VANDERZANDE, Dirk; DE SCHEPPER, Luc; MANCA, JeanJournal ContributionA1
42005Absorption phenomena in organic thin films for solar cell applications investigated by photothermal defelction spectroscopyGORIS, Ludwig; HAENEN, Ken; NESLADEK, Milos; WAGNER, Patrick; VANDERZANDE, Dirk; DE SCHEPPER, Luc; D'HAEN, Jan; LUTSEN, Laurence; MANCA, JeanJournal ContributionA1
52005Understanding Oxide Degradation Mechanisms in ultra-thin SiO2 through High-Speed, High Resolution in-situ MeasurementsARESU, Stefano; DE CEUNINCK, Ward; Degraeve, R.; Kaczer, B.; KNUYT, Gilbert; DE SCHEPPER, LucJournal ContributionA1
62004Low-level optical absorption phenomena in organic thin films for solar cell applications investigated by high sensitive photocurrent and photothermal techniquesGORIS, Ludwig; HAENEN, Ken; NESLADEK, Milos; Poruba, A.; Vanecek, M.; WAGNER, Patrick; LUTSEN, Laurence; MANCA, Jean; VANDERZANDE, Dirk; DE SCHEPPER, LucProceedings PaperC1
72004Nanostructured organic pn junctions towards 3D photovoltaicsMARTENS, Tom; MUNTERS, Tom; GORIS, Ludwig; D'HAEN, Jan; SCHOUTEDEN, Bram; D'OLIESLAEGER, Marc; LUTSEN, Laurence; VANDERZANDE, Dirk; Geens, W; POORTMANS, Jef; DE SCHEPPER, Luc; MANCA, JeanJournal ContributionA1
82004The phosphorous level fine structure in homoepitaxial and polycrystalline n-type CVD diamondHAENEN, Ken; NESLADEK, Milos; DE SCHEPPER, Luc; Kravets, R; Vanecek, M; Koizumi, SJournal ContributionA1
92003Application of general finite mixture models to reliability data using likelihood estimationANDRIES, Ellen; CROES, Kristof; DE SCHEPPER, Luc; MOLENBERGHS, GeertProceedings PaperC2
102003In-situ electrical and spectroscopical techniques for the study of degradation mechanisms and life time prediction of organic based electronic material systemsMANCA, Jean; GORIS, Ludwig; KESTERS, Els; LUTSEN, Laurence; MARTENS, Tom; HAENEN, Ken; NESLADEK, Milos; SANNA, Ornella; VANDERZANDE, Dirk; D'HAEN, Jan; DE SCHEPPER, LucProceedings PaperC1
112003In-situ electrical and spectroscopical techniques for the study of degradation mechanisms and life time prediction of organic based electronic material systemsMANCA, Jean; GORIS, Ludwig; KESTERS, Els; LUTSEN, Laurence; MARTENS, Tom; HAENEN, Ken; NESLADEK, Milos; VANDERZANDE, Dirk; D'HAEN, Jan; DE SCHEPPER, Luc; SANNA, OrnellaProceedings PaperC1
122003Morphology of MDMO-PPV: PCBM bulk hetero-junction organic solar cells studied by AFM, KFM and TEMMARTENS, Tom; BEELEN, Zjef; D'HAEN, Jan; MUNTERS, Tom; GORIS, Ludwig; MANCA, Jean; D'OLIESLAEGER, Marc; VANDERZANDE, Dirk; DE SCHEPPER, Luc; Andriessen, RonnProceedings PaperC1
132003Study of the relation between nano-morphology and photovoltaic characteristics of MDMO-PVV: PCBM bulk hetero-junction organic solar cellsMARTENS, Tom; D'HAEN, Jan; MANCA, Jean; D'OLIESLAEGER, Marc; VANDERZANDE, Dirk; DE SCHEPPER, LucJournal ContributionA3
142003A new method for the analysis of high-resolution SILC dataARESU, Stefano; DE CEUNINCK, Ward; KNUYT, Gilbert; MERTENS, Johan; MANCA, Jean; DE SCHEPPER, Luc; DEGRAEVE, Maria; Kaczer, B.; D'OLIESLAEGER, Marc; D'HAEN, JanJournal ContributionA1
152003Poly (5,6-dithiooctylisothianaphtene), a new low band gap polymer: spectroscopy and solar cell constructionGORIS, Ludwig; Loi, MA; Cravino, A; Neugebauer, H; Sariciftci, NS; POLEC, Iwona; LUTSEN, Laurence; ANDRIES, Ellen; MANCA, Jean; DE SCHEPPER, Luc; VANDERZANDE, DirkJournal ContributionA1
162003Disclosure of the nanostructure of MDMO-PPV : PCBM bulk hetero-junction organic solar cells by a combination of SPM and TEMMARTENS, Tom; D'HAEN, Jan; MUNTERS, Tom; BEELEN, Zjef; GORIS, Ludwig; MANCA, Jean; D'OLIESLAEGER, Marc; VANDERZANDE, Dirk; DE SCHEPPER, Luc; Andriessen, RonnJournal ContributionA1
172002The influence of the microstructure upon the photovoltaic performance of MDMO-PPV:PCBM bulk hetero-junction organic solar cellsMARTENS, Tom; D'HAEN, Jan; MUNTERS, Tom; GORIS, Ludwig; BEELEN, Zjef; MANCA, Jean; D'OLIESLAEGER, Marc; VANDERZANDE, Dirk; DE SCHEPPER, Luc; Andriessen, RonnProceedings PaperC1
182002Exploring the limits of Arrhenius-based life testing with heterojunction bipolar transistor technologyPETERSEN, Rainer; DE CEUNINCK, Ward; D'HAEN, Jan; D'OLIESLAEGER, Marc; DE SCHEPPER, Luc; Vendier, O; Blanck, HJournal ContributionA1
192002Statistical aspects of the degradation of LDD nMOSFETsANDRIES, Ellen; DREESEN, Raf; CROES, Kristof; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Groeseneken, G; Lo, KF; D'OLIESLAEGER, Marc; D'HAEN, JanJournal ContributionA1
202002A comparison between state-of-the-art 'gilch' and 'sulphinyl' synthesised MDMO-PPV/PCBM bulk hetero-junction solar cellsMUNTERS, Tom; MARTENS, Tom; GORIS, Ludwig; VRINDTS, Veerle; MANCA, Jean; LUTSEN, Laurence; DE CEUNINCK, Ward; VANDERZANDE, Dirk; DE SCHEPPER, Luc; GELAN, Jan; Sariciftci, NS; Brabec, CJJournal ContributionA1
212002Influence of annealing on the electronic properties of chemical vapor deposited diamond films studied by high vacuum scanning tunneling microscopy and spectroscopyCannaerts, M; NESLADEK, Milos; HAENEN, Ken; DE SCHEPPER, Luc; STALS, Mark; Van Haesendonck, CJournal ContributionA1
222002High-resolution SILC measurements of thin SiO2 ultra low voltagesARESU, Stefano; DE CEUNINCK, Ward; DREESEN, Raf; CROES, Kristof; ANDRIES, Ellen; MANCA, Jean; DE SCHEPPER, Luc; DEGRAEVE, Maria; Kaczer, B.; D'OLIESLAEGER, Marc; D'HAEN, JanJournal ContributionA1
232001Study of UV and subgap photocurrent response in diamond and BCN thin films for detector applicationsNESLADEK, Milos; Vanecek, M; MEYKENS, Kristien; HAENEN, Ken; MANCA, Jean; DE SCHEPPER, Luc; Pace, E; Pini, A; Rinati, GV; Kimura, C; Etou, Y; Sugino, TJournal ContributionA1
242001Reversible switching of the surface conductance of hydrogenated CVD diamond filmsCannaerts, M; NESLADEK, Milos; HAENEN, Ken; STALS, Lambert; DE SCHEPPER, Luc; Van Haesendonck, CJournal ContributionA1
252001Origin of hydrogen-related surface conductivity in chemical vapor deposited diamond filmsCannaerts, M.; NESLADEK, Milos; HAENEN, Ken; DE SCHEPPER, Luc; Maslova, N.S.; van Haesendonck, C.Journal ContributionA3
262001Determination of the thermal resistance and current exponent of heterojunction bipolar transistors for reliability evaluationPETERSEN, Rainer; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Vendier, O; Blanck, H; Pons, DJournal ContributionA1
272001A new degradation model and lifetime extrapolation technique for lightly doped drain nMOSFETs under hot-carrier degradationDREESEN, Raf; CROES, Kristof; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Pergoot, A; Groeseneken, GJournal ContributionA1
282001High-resolution in-situ study of gold electromigration: test time reductionCROES, Kristof; DREESEN, Raf; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Tielemans, L; Van der Wel, PJournal ContributionA1
292000A novel non-destructive method for assessing the thermal resistance of power GaAs RF-MMIC amplifiersPETERSEN, Rainer; DE CEUNINCK, Ward; DE SCHEPPER, LucProceedings PaperC1
302000Reliability aspects of high temperature power MOSFETsMANCA, Jean; Wondrak, W; Schaper, W; CROES, Kristof; D'HAEN, Jan; DE CEUNINCK, Ward; Dieval, B; Hartnagel, HL; D'OLIESLAEGER, Marc; DE SCHEPPER, LucJournal ContributionA1
312000The stability of Pt heater and temperature sensing elements for silicon integrated tin oxide gas sensorsEsch, H; Huyberechts, G; Mertens, R.; Maes, Guido; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, LucJournal ContributionA1
322000Investigation of the formation process of MCs+-molecular ions during sputteringVLEKKEN, Johan; D'OLIESLAEGER, Marc; KNUYT, Gilbert; Vandervorst, W; DE SCHEPPER, LucJournal ContributionA1
332000Investigation of the formation of sputtered oxide clusters with the Laser Assisted Sputtered Neutral Mass Spectroscopy technique (LASNMS)VLEKKEN, Johan; POLUS, Dany; D'OLIESLAEGER, Marc; Vandervorst, W.; DE SCHEPPER, LucProceedings PaperC2
342000In-situ SEM observation of electromigration in thin metal films at accelerated stress conditionsD'HAEN, Jan; VAN OLMEN, Jan; BEELEN, Zjef; MANCA, Jean; MARTENS, Tom; DE CEUNINCK, Ward; D'OLIESLAEGER, Marc; DE SCHEPPER, Luc; Cannaerts, M; Maex, KJournal ContributionA1
352000A method to minimize test times for accelerated testing of pHEMT's by analysis of the elctronic fingerprint of the initial stage of degradationPETERSEN, Rainer; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Muraro, J.-L.Journal ContributionA1
361999The kinetics of the early stages of electromigration and concurrent temperature induced processes in thin film metallisations studied by means of an in-situ high resolution resistometric techniqueVAN OLMEN, Jan; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; D'Haeger, V; Witvrouw, A; Maex, K; Vandevelde, B; Beyne, E; Tielemans, LJournal Contribution
371999Dynamics of electromigration induced void/hillock growth and precipitation/dissolution of addition elements studied by in-situ scanning electron microscopy resistance measurementsD'HAEN, Jan; COSEMANS, Patrick Peter; MANCA, Jean; LEKENS, Geert; MARTENS, Tom; DE CEUNINCK, Ward; D'OLIESLAEGER, Marc; DE SCHEPPER, Luc; Maex, KJournal Contribution
381999Modelling hot-carrier degradation of LDD NMOSFETs by using a high-resolution measurement technique.DREESEN, Raf; CROES, Kristof; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Pergoot, A; Groeseneken, GJournal Contribution
391999Investigation of the formation of M-2(+)-molecular ions in sputtering processesVLEKKEN, Johan; CROES, Kristof; WU, Ting-Di; D'OLIESLAEGER, Marc; KNUYT, Gilbert; Vandervorst, W; DE SCHEPPER, LucJournal Contribution
401999High electrical resistivity of CVD-diamondMANCA, Jean; NESLADEK, Milos; Neelen, M; QUAEYHAEGENS, Carl; DE SCHEPPER, Luc; DE CEUNINCK, WardJournal Contribution
411999Application of new PPV precursor polymers in organic LEDsKIEBOOMS, Rafael; Zojer, E.; Markart, P.; Resel, R.; DE SCHEPPER, Luc; VANDERZANDE, Dirk; GELAN, Jan; STALS, Lambert; Tasch, S.; Leising, G.Journal Contribution
421998Monte Carlo simulation of the formation of M2+-molecular ions sputtered from metallic materialsVLEKKEN, Johan; WU, Ting-Di; D'OLIESLAEGER, Marc; KNUYT, Gilbert; DE SCHEPPER, Luc; Vandervorst, W.Proceedings Paper
431998Investigation of correlations between parameters defining the state of sputtered particlesVLEKKEN, Johan; CROES, Kristof; D'OLIESLAEGER, Marc; KNUYT, Gilbert; Vandervorst, W.; DE SCHEPPER, LucProceedings Paper
441998The dependence of stress induced voiding on line width studied by conventional and high resolution resistance measurementsWitvrouw, A; Maex, K; DE CEUNINCK, Ward; LEKENS, Geert; D'HAEN, Jan; DE SCHEPPER, LucJournal Contribution
451998The influence of addition elements on the early resistance changes observed during electromigration testing of Al metal linesDE CEUNINCK, Ward; D'Haeger, V; VAN OLMEN, Jan; Witvrouw, A; Maex, K; DE SCHEPPER, Luc; De Pauw, P; Pergoot, AJournal Contribution
461998Overview of the kinetics of the early stages of electromigration under low (= realistic) current density stressVAN OLMEN, Jan; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; D'Haeger, V; Witvrouw, A; Maex, KJournal Contribution
471998Analysis of the operating conditions of ETP electron multipliers used on Cameca IMS instrumentsWU, Ting-Di; VLEKKEN, Johan; D'OLIESLAEGER, Marc; DE SCHEPPER, LucProceedings Paper
481998Electrical characterization and reliability evaluation of capacitors by means of in situ leakage current measurementsMANCA, Jean; CROES, Kristof; DE SCHEPPER, Luc; DE CEUNINCK, Ward; STALS, Lambert; Jacques, L; Tielemans, L; Gerrits, N; Hoppener, RJournal Contribution
491998Study of Cu diffusion in an Al-1 wt%Si-0.5 wt%Cu bond pad with an Al-1 wt%Si bond wire attached using scanning electron microscopyCOSEMANS, Patrick; D'HAEN, Jan; Witvrouw, A; Proost, J; D'OLIESLAEGER, Marc; DE CEUNINCK, Ward; Maex, K; DE SCHEPPER, LucJournal Contribution
501998Bimodal failure behaviour of metal film resistorsCROES, Kristof; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Tielemans, LJournal Contribution
511998Quantitation of major elements with secondary ion mass spectrometry by using M-2(+)-molecular ionsVLEKKEN, Johan; WU, Ting-Di; D'OLIESLAEGER, Marc; KNUYT, Gilbert; Vandervorst, W; DE SCHEPPER, LucJournal Contribution
521998Localized monitoring of electromigration with early resistance change measurementsMANCA, Jean; CROES, Kristof; DE CEUNINCK, Ward; D'Haeger, V; D'HAEN, Jan; Depauw, P; Tielemans, L; DE SCHEPPER, LucJournal Contribution
531998Evaluation of the energy selection optics of Cameca IMS instruments using Fast Fourier Transforms (FFT)VLEKKEN, Johan; WU, Ting-Di; D'OLIESLAEGER, Marc; KNUYT, Gilbert; DE SCHEPPER, LucProceedings Paper
541998A new precursor to electroconducting conjugated polymers: Synthesis and opto-electrical properties of luminescent devices based on these PPV derivativesBijnens, W; Van Der Borght, M; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; VANDERZANDE, Dirk; STALS, Lambert; GELAN, JanJournal Contribution