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| | Issue Date | Title | Contributor(s) | Type | Cat. |
| 1 | 2018 | Een nieuw oriënteringsinstrument – met hoge correlatie met reëel studiesucces – voor de begeleiding van de studiekeuze naar de universiteit toe | NAUWELAERTS, Erna; DOUMEN, Sarah; VERHAERT, Guido; MOLENBERGHS, Geert; DE SCHEPPER, Luc | Journal Contribution | A1 |
| 2 | 2014 | Effectiviteit van toelatingsproeven | NAUWELAERTS, Erna; DOUMEN, Sarah; DE SCHEPPER, Luc | Journal Contribution | A1 |
| 3 | 2006 | Observation of the subgap optical absorption in polymer-fullerene blend solar cells | GORIS, Ludwig; Poruba, A.; Hod'akova, L.; Vanecek, M.; HAENEN, Ken; NESLADEK, Milos; WAGNER, Patrick; VANDERZANDE, Dirk; DE SCHEPPER, Luc; MANCA, Jean | Journal Contribution | A1 |
| 4 | 2005 | Absorption phenomena in organic thin films for solar cell applications investigated by photothermal defelction spectroscopy | GORIS, Ludwig; HAENEN, Ken; NESLADEK, Milos; WAGNER, Patrick; VANDERZANDE, Dirk; DE SCHEPPER, Luc; D'HAEN, Jan; LUTSEN, Laurence; MANCA, Jean | Journal Contribution | A1 |
| 5 | 2005 | Understanding Oxide Degradation Mechanisms in ultra-thin SiO2 through High-Speed, High Resolution in-situ Measurements | ARESU, Stefano; DE CEUNINCK, Ward; Degraeve, R.; Kaczer, B.; KNUYT, Gilbert; DE SCHEPPER, Luc | Journal Contribution | A1 |
| 6 | 2004 | Low-level optical absorption phenomena in organic thin films for solar cell applications investigated by high sensitive photocurrent and photothermal techniques | GORIS, Ludwig; HAENEN, Ken; NESLADEK, Milos; Poruba, A.; Vanecek, M.; WAGNER, Patrick; LUTSEN, Laurence; MANCA, Jean; VANDERZANDE, Dirk; DE SCHEPPER, Luc | Proceedings Paper | C1 |
| 7 | 2004 | Nanostructured organic pn junctions towards 3D photovoltaics | MARTENS, Tom; MUNTERS, Tom; GORIS, Ludwig; D'HAEN, Jan; SCHOUTEDEN, Bram; D'OLIESLAEGER, Marc; LUTSEN, Laurence; VANDERZANDE, Dirk; Geens, W; POORTMANS, Jef; DE SCHEPPER, Luc; MANCA, Jean | Journal Contribution | A1 |
| 8 | 2004 | The phosphorous level fine structure in homoepitaxial and polycrystalline n-type CVD diamond | HAENEN, Ken; NESLADEK, Milos; DE SCHEPPER, Luc; Kravets, R; Vanecek, M; Koizumi, S | Journal Contribution | A1 |
| 9 | 2003 | Application of general finite mixture models to reliability data using likelihood estimation | ANDRIES, Ellen; CROES, Kristof; DE SCHEPPER, Luc; MOLENBERGHS, Geert | Proceedings Paper | C2 |
| 10 | 2003 | In-situ electrical and spectroscopical techniques for the study of degradation mechanisms and life time prediction of organic based electronic material systems | MANCA, Jean; GORIS, Ludwig; KESTERS, Els; LUTSEN, Laurence; MARTENS, Tom; HAENEN, Ken; NESLADEK, Milos; SANNA, Ornella; VANDERZANDE, Dirk; D'HAEN, Jan; DE SCHEPPER, Luc | Proceedings Paper | C1 |
| 11 | 2003 | In-situ electrical and spectroscopical techniques for the study of degradation mechanisms and life time prediction of organic based electronic material systems | MANCA, Jean; GORIS, Ludwig; KESTERS, Els; LUTSEN, Laurence; MARTENS, Tom; HAENEN, Ken; NESLADEK, Milos; VANDERZANDE, Dirk; D'HAEN, Jan; DE SCHEPPER, Luc; SANNA, Ornella | Proceedings Paper | C1 |
| 12 | 2003 | Morphology of MDMO-PPV: PCBM bulk hetero-junction organic solar cells studied by AFM, KFM and TEM | MARTENS, Tom; BEELEN, Zjef; D'HAEN, Jan; MUNTERS, Tom; GORIS, Ludwig; MANCA, Jean; D'OLIESLAEGER, Marc; VANDERZANDE, Dirk; DE SCHEPPER, Luc; Andriessen, Ronn | Proceedings Paper | C1 |
| 13 | 2003 | Study of the relation between nano-morphology and photovoltaic characteristics of MDMO-PVV: PCBM bulk hetero-junction organic solar cells | MARTENS, Tom; D'HAEN, Jan; MANCA, Jean; D'OLIESLAEGER, Marc; VANDERZANDE, Dirk; DE SCHEPPER, Luc | Journal Contribution | A3 |
| 14 | 2003 | A new method for the analysis of high-resolution SILC data | ARESU, Stefano; DE CEUNINCK, Ward; KNUYT, Gilbert; MERTENS, Johan; MANCA, Jean; DE SCHEPPER, Luc; DEGRAEVE, Maria; Kaczer, B.; D'OLIESLAEGER, Marc; D'HAEN, Jan | Journal Contribution | A1 |
| 15 | 2003 | Poly (5,6-dithiooctylisothianaphtene), a new low band gap polymer: spectroscopy and solar cell construction | GORIS, Ludwig; Loi, MA; Cravino, A; Neugebauer, H; Sariciftci, NS; POLEC, Iwona; LUTSEN, Laurence; ANDRIES, Ellen; MANCA, Jean; DE SCHEPPER, Luc; VANDERZANDE, Dirk | Journal Contribution | A1 |
| 16 | 2003 | Disclosure of the nanostructure of MDMO-PPV : PCBM bulk hetero-junction organic solar cells by a combination of SPM and TEM | MARTENS, Tom; D'HAEN, Jan; MUNTERS, Tom; BEELEN, Zjef; GORIS, Ludwig; MANCA, Jean; D'OLIESLAEGER, Marc; VANDERZANDE, Dirk; DE SCHEPPER, Luc; Andriessen, Ronn | Journal Contribution | A1 |
| 17 | 2002 | The influence of the microstructure upon the photovoltaic performance of MDMO-PPV:PCBM bulk hetero-junction organic solar cells | MARTENS, Tom; D'HAEN, Jan; MUNTERS, Tom; GORIS, Ludwig; BEELEN, Zjef; MANCA, Jean; D'OLIESLAEGER, Marc; VANDERZANDE, Dirk; DE SCHEPPER, Luc; Andriessen, Ronn | Proceedings Paper | C1 |
| 18 | 2002 | Exploring the limits of Arrhenius-based life testing with heterojunction bipolar transistor technology | PETERSEN, Rainer; DE CEUNINCK, Ward; D'HAEN, Jan; D'OLIESLAEGER, Marc; DE SCHEPPER, Luc; Vendier, O; Blanck, H | Journal Contribution | A1 |
| 19 | 2002 | Statistical aspects of the degradation of LDD nMOSFETs | ANDRIES, Ellen; DREESEN, Raf; CROES, Kristof; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Groeseneken, G; Lo, KF; D'OLIESLAEGER, Marc; D'HAEN, Jan | Journal Contribution | A1 |
| 20 | 2002 | A comparison between state-of-the-art 'gilch' and 'sulphinyl' synthesised MDMO-PPV/PCBM bulk hetero-junction solar cells | MUNTERS, Tom; MARTENS, Tom; GORIS, Ludwig; VRINDTS, Veerle; MANCA, Jean; LUTSEN, Laurence; DE CEUNINCK, Ward; VANDERZANDE, Dirk; DE SCHEPPER, Luc; GELAN, Jan; Sariciftci, NS; Brabec, CJ | Journal Contribution | A1 |
| 21 | 2002 | Influence of annealing on the electronic properties of chemical vapor deposited diamond films studied by high vacuum scanning tunneling microscopy and spectroscopy | Cannaerts, M; NESLADEK, Milos; HAENEN, Ken; DE SCHEPPER, Luc; STALS, Mark; Van Haesendonck, C | Journal Contribution | A1 |
| 22 | 2002 | High-resolution SILC measurements of thin SiO2 ultra low voltages | ARESU, Stefano; DE CEUNINCK, Ward; DREESEN, Raf; CROES, Kristof; ANDRIES, Ellen; MANCA, Jean; DE SCHEPPER, Luc; DEGRAEVE, Maria; Kaczer, B.; D'OLIESLAEGER, Marc; D'HAEN, Jan | Journal Contribution | A1 |
| 23 | 2001 | Study of UV and subgap photocurrent response in diamond and BCN thin films for detector applications | NESLADEK, Milos; Vanecek, M; MEYKENS, Kristien; HAENEN, Ken; MANCA, Jean; DE SCHEPPER, Luc; Pace, E; Pini, A; Rinati, GV; Kimura, C; Etou, Y; Sugino, T | Journal Contribution | A1 |
| 24 | 2001 | Reversible switching of the surface conductance of hydrogenated CVD diamond films | Cannaerts, M; NESLADEK, Milos; HAENEN, Ken; STALS, Lambert; DE SCHEPPER, Luc; Van Haesendonck, C | Journal Contribution | A1 |
| 25 | 2001 | Origin of hydrogen-related surface conductivity in chemical vapor deposited diamond films | Cannaerts, M.; NESLADEK, Milos; HAENEN, Ken; DE SCHEPPER, Luc; Maslova, N.S.; van Haesendonck, C. | Journal Contribution | A3 |
| 26 | 2001 | Determination of the thermal resistance and current exponent of heterojunction bipolar transistors for reliability evaluation | PETERSEN, Rainer; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Vendier, O; Blanck, H; Pons, D | Journal Contribution | A1 |
| 27 | 2001 | A new degradation model and lifetime extrapolation technique for lightly doped drain nMOSFETs under hot-carrier degradation | DREESEN, Raf; CROES, Kristof; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Pergoot, A; Groeseneken, G | Journal Contribution | A1 |
| 28 | 2001 | High-resolution in-situ study of gold electromigration: test time reduction | CROES, Kristof; DREESEN, Raf; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Tielemans, L; Van der Wel, P | Journal Contribution | A1 |
| 29 | 2000 | A novel non-destructive method for assessing the thermal resistance of power GaAs RF-MMIC amplifiers | PETERSEN, Rainer; DE CEUNINCK, Ward; DE SCHEPPER, Luc | Proceedings Paper | C1 |
| 30 | 2000 | Reliability aspects of high temperature power MOSFETs | MANCA, Jean; Wondrak, W; Schaper, W; CROES, Kristof; D'HAEN, Jan; DE CEUNINCK, Ward; Dieval, B; Hartnagel, HL; D'OLIESLAEGER, Marc; DE SCHEPPER, Luc | Journal Contribution | A1 |
| 31 | 2000 | The stability of Pt heater and temperature sensing elements for silicon integrated tin oxide gas sensors | Esch, H; Huyberechts, G; Mertens, R.; Maes, Guido; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc | Journal Contribution | A1 |
| 32 | 2000 | Investigation of the formation process of MCs+-molecular ions during sputtering | VLEKKEN, Johan; D'OLIESLAEGER, Marc; KNUYT, Gilbert; Vandervorst, W; DE SCHEPPER, Luc | Journal Contribution | A1 |
| 33 | 2000 | Investigation of the formation of sputtered oxide clusters with the Laser Assisted Sputtered Neutral Mass Spectroscopy technique (LASNMS) | VLEKKEN, Johan; POLUS, Dany; D'OLIESLAEGER, Marc; Vandervorst, W.; DE SCHEPPER, Luc | Proceedings Paper | C2 |
| 34 | 2000 | In-situ SEM observation of electromigration in thin metal films at accelerated stress conditions | D'HAEN, Jan; VAN OLMEN, Jan; BEELEN, Zjef; MANCA, Jean; MARTENS, Tom; DE CEUNINCK, Ward; D'OLIESLAEGER, Marc; DE SCHEPPER, Luc; Cannaerts, M; Maex, K | Journal Contribution | A1 |
| 35 | 2000 | A method to minimize test times for accelerated testing of pHEMT's by analysis of the elctronic fingerprint of the initial stage of degradation | PETERSEN, Rainer; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Muraro, J.-L. | Journal Contribution | A1 |
| 36 | 1999 | The kinetics of the early stages of electromigration and concurrent temperature induced processes in thin film metallisations studied by means of an in-situ high resolution resistometric technique | VAN OLMEN, Jan; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; D'Haeger, V; Witvrouw, A; Maex, K; Vandevelde, B; Beyne, E; Tielemans, L | Journal Contribution | |
| 37 | 1999 | Dynamics of electromigration induced void/hillock growth and precipitation/dissolution of addition elements studied by in-situ scanning electron microscopy resistance measurements | D'HAEN, Jan; COSEMANS, Patrick Peter; MANCA, Jean; LEKENS, Geert; MARTENS, Tom; DE CEUNINCK, Ward; D'OLIESLAEGER, Marc; DE SCHEPPER, Luc; Maex, K | Journal Contribution | |
| 38 | 1999 | Modelling hot-carrier degradation of LDD NMOSFETs by using a high-resolution measurement technique. | DREESEN, Raf; CROES, Kristof; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Pergoot, A; Groeseneken, G | Journal Contribution | |
| 39 | 1999 | Investigation of the formation of M-2(+)-molecular ions in sputtering processes | VLEKKEN, Johan; CROES, Kristof; WU, Ting-Di; D'OLIESLAEGER, Marc; KNUYT, Gilbert; Vandervorst, W; DE SCHEPPER, Luc | Journal Contribution | |
| 40 | 1999 | High electrical resistivity of CVD-diamond | MANCA, Jean; NESLADEK, Milos; Neelen, M; QUAEYHAEGENS, Carl; DE SCHEPPER, Luc; DE CEUNINCK, Ward | Journal Contribution | |
| 41 | 1999 | Application of new PPV precursor polymers in organic LEDs | KIEBOOMS, Rafael; Zojer, E.; Markart, P.; Resel, R.; DE SCHEPPER, Luc; VANDERZANDE, Dirk; GELAN, Jan; STALS, Lambert; Tasch, S.; Leising, G. | Journal Contribution | |
| 42 | 1998 | Monte Carlo simulation of the formation of M2+-molecular ions sputtered from metallic materials | VLEKKEN, Johan; WU, Ting-Di; D'OLIESLAEGER, Marc; KNUYT, Gilbert; DE SCHEPPER, Luc; Vandervorst, W. | Proceedings Paper | |
| 43 | 1998 | Investigation of correlations between parameters defining the state of sputtered particles | VLEKKEN, Johan; CROES, Kristof; D'OLIESLAEGER, Marc; KNUYT, Gilbert; Vandervorst, W.; DE SCHEPPER, Luc | Proceedings Paper | |
| 44 | 1998 | The dependence of stress induced voiding on line width studied by conventional and high resolution resistance measurements | Witvrouw, A; Maex, K; DE CEUNINCK, Ward; LEKENS, Geert; D'HAEN, Jan; DE SCHEPPER, Luc | Journal Contribution | |
| 45 | 1998 | The influence of addition elements on the early resistance changes observed during electromigration testing of Al metal lines | DE CEUNINCK, Ward; D'Haeger, V; VAN OLMEN, Jan; Witvrouw, A; Maex, K; DE SCHEPPER, Luc; De Pauw, P; Pergoot, A | Journal Contribution | |
| 46 | 1998 | Overview of the kinetics of the early stages of electromigration under low (= realistic) current density stress | VAN OLMEN, Jan; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; D'Haeger, V; Witvrouw, A; Maex, K | Journal Contribution | |
| 47 | 1998 | Analysis of the operating conditions of ETP electron multipliers used on Cameca IMS instruments | WU, Ting-Di; VLEKKEN, Johan; D'OLIESLAEGER, Marc; DE SCHEPPER, Luc | Proceedings Paper | |
| 48 | 1998 | Electrical characterization and reliability evaluation of capacitors by means of in situ leakage current measurements | MANCA, Jean; CROES, Kristof; DE SCHEPPER, Luc; DE CEUNINCK, Ward; STALS, Lambert; Jacques, L; Tielemans, L; Gerrits, N; Hoppener, R | Journal Contribution | |
| 49 | 1998 | Study of Cu diffusion in an Al-1 wt%Si-0.5 wt%Cu bond pad with an Al-1 wt%Si bond wire attached using scanning electron microscopy | COSEMANS, Patrick; D'HAEN, Jan; Witvrouw, A; Proost, J; D'OLIESLAEGER, Marc; DE CEUNINCK, Ward; Maex, K; DE SCHEPPER, Luc | Journal Contribution | |
| 50 | 1998 | Bimodal failure behaviour of metal film resistors | CROES, Kristof; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Tielemans, L | Journal Contribution | |
| 51 | 1998 | Quantitation of major elements with secondary ion mass spectrometry by using M-2(+)-molecular ions | VLEKKEN, Johan; WU, Ting-Di; D'OLIESLAEGER, Marc; KNUYT, Gilbert; Vandervorst, W; DE SCHEPPER, Luc | Journal Contribution | |
| 52 | 1998 | Localized monitoring of electromigration with early resistance change measurements | MANCA, Jean; CROES, Kristof; DE CEUNINCK, Ward; D'Haeger, V; D'HAEN, Jan; Depauw, P; Tielemans, L; DE SCHEPPER, Luc | Journal Contribution | |
| 53 | 1998 | Evaluation of the energy selection optics of Cameca IMS instruments using Fast Fourier Transforms (FFT) | VLEKKEN, Johan; WU, Ting-Di; D'OLIESLAEGER, Marc; KNUYT, Gilbert; DE SCHEPPER, Luc | Proceedings Paper | |
| 54 | 1998 | A new precursor to electroconducting conjugated polymers: Synthesis and opto-electrical properties of luminescent devices based on these PPV derivatives | Bijnens, W; Van Der Borght, M; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; VANDERZANDE, Dirk; STALS, Lambert; GELAN, Jan | Journal Contribution | |
| 55 | 1998 | Effect of oxygen on the electrical characteristics of PPV-LEDs | MANCA, Jean; Bijnens, W; KIEBOOMS, Rafael; D'HAEN, Jan; D'OLIESLAEGER, Marc; WU, Ting-Di; DE CEUNINCK, Ward; DE SCHEPPER, Luc; VANDERZANDE, Dirk; GELAN, Jan; STALS, Mark | Journal Contribution | |
| 56 | 1998 | Electrical field induced ageing of polymer light-emitting diodes in an oxygen-rich atmosphere studied by emission microscopy, scanning electron microscopy and secondary ion mass spectroscopy | Bijnens, W; De Wolf, I; MANCA, Jean; D'HAEN, Jan; WU, Ting-Di; D'OLIESLAEGER, Marc; Beyne, E; KIEBOOMS, Rafael; VANDERZANDE, Dirk; GELAN, Jan; DE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, Lambert | Journal Contribution | |
| 57 | 1998 | The time of 'guessing' your failure time distribution is over! | CROES, Kristof; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; MOLENBERGHS, Geert | Journal Contribution | |
| 58 | 1997 | A high resolution method for measuring hot carrier degradation in matched transistor pairs | DREESEN, Raf; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Groeseneken, G. | Proceedings Paper | |
| 59 | 1997 | The thermally balanced bridge technique (TBBT): A new high resolution resistometric measurement technique for the study of electromigration-induced early resistance changes in metal stripes | VAN OLMEN, Jan; DE CEUNINCK, Ward; DE SCHEPPER, Luc; GOLDONI, Alessandro; Cervini, A; Fantini, F | Journal Contribution | |
| 60 | 1997 | In-situ study of the degradation behaviour of GaAs MESFETs for hi-rel applications | PETERSEN, Rainer; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Gregoris, G | Journal Contribution | |
| 61 | 1997 | Design of a new test structure for the study of electromigration with early resistance change measurements | DE CEUNINCK, Ward; MANCA, Jean; D'Haeger, V; VAN OLMEN, Jan; DE SCHEPPER, Luc; STALS, Lambert | Journal Contribution | |
| 62 | 1996 | Electrical characterisation and reliability studies of thick film gas sensor structures. | CZECH, Jan; MANCA, Jean; Roggen J; Huyberechts G; STALS, Lambert; DE SCHEPPER, Luc | Proceedings Paper | |
| 63 | 1996 | Evaluation on a two-day time scale of high-reliability electronic assemblies by in-situ electrical and opto-mechanical test techniques | Gregoris, G.; Bouton, F.; DeKeukeleire, C.; Siliprandi, P.; Baio, F.; DE SCHEPPER, Luc; DE CEUNINCK, Ward; Tielemans, L.; Ahrens, T.; Krumm, M. | Journal Contribution | |
| 64 | 1996 | A new technique to characterize the early stages of electromigration-induced resistance changes at low current densities | DHaeger, V; DE CEUNINCK, Ward; KNUYT, Gilbert; DE SCHEPPER, Luc; STALS, Lambert | Journal Contribution | |
| 65 | 1996 | Quantitative analysis of the compound layer of plasma nitrided pure iron | D'HAEN, Jan; D'OLIESLAEGER, Marc; DE SCHEPPER, Luc; STALS, Lambert | Journal Contribution | |
| 66 | 1996 | Monte Carlo simulation of the formation of MCs(+) molecular ions | VLEKKEN, Johan; WU, Ting-Di; D'OLIESLAEGER, Marc; KNUYT, Gilbert; DE SCHEPPER, Luc; STALS, Lambert | Journal Contribution | |
| 67 | 1996 | Study of the microstructure of IC interconnect metallisations using analytical transmission electron microscopy and secondary ion mass spectrometry | COSEMANS, Patrick Peter; D'OLIESLAEGER, Marc; DE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, Lambert | Journal Contribution | |
| 68 | 1996 | Characterization of the early stages of electromigration in Al-based metal lines by means of a high resloution resistance monitoring technique based on an extremely stable ambient temperature | DE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, Lambert; d' Haeger, V. | Proceedings Paper | |
| 69 | 1996 | A re-interpretation of the existence of a spectrum of activation energies for the microstructural changes in Al 1% Si lines | Stulens, Herwig; KNUYT, Gilbert; DE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, Lambert | Journal Contribution | |
| 70 | 1996 | On the deposition and characterization of thin SnO2 films | CZECH, I.; DE SCHEPPER, Luc; STALS, Lambert; Roggen, J.; Huyberechts, G. | Proceedings Paper | |
| 71 | 1996 | Imaging of the ageing on organic electroluminescent diodes, under different atmospheres by impedance spectroscopy, scanning electron microscopy and SIMS depth profiling analysis | Bijnens, W; MANCA, Jean; WU, Ting-Di; D'OLIESLAEGER, Marc; VANDERZANDE, Dirk; GELAN, Jan; DE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, Lambert | Journal Contribution | |
| 72 | 1995 | IN-SITU FAILURE-DETECTION IN THICK-FILM MULTILAYER SYSTEMS | MANCA, Jean; DE SCHEPPER, Luc; DE CEUNINCK, Ward; D'OLIESLAEGER, Marc; STALS, Lambert | Journal Contribution | |
| 73 | 1995 | Evaluation on a two days time scale of high reliability electronic assemblies by in-situ electrical and optomechanical tests techniques | Gregoris, G.; Bouton, F.; de Keukeleire, C.; Siliprandi, P.; Baio, F.; DE SCHEPPER, Luc; DE CEUNINCK, Ward; Tielemans, L.; Ahrens, T.; Krumm, M. | Proceedings Paper | |
| 74 | 1995 | Thermal degradation of power modules | Tielemans, L.; Gregoris, G.; DE SCHEPPER, Luc; D' OLIESLAEGER, Marc | Conference Material | |
| 75 | 1994 | Reliability study of on-chip interconnects - prediction of electromigration resistance on a short-time scale | DE CEUNINCK, Ward; D'Haeger, V; Stulens, Herwig; DE SCHEPPER, Luc; STALS, Lambert | Proceedings Paper | |
| 76 | 1994 | The use of early resistance and early tcr changes to predict the reliability of on-chip interconnects | D'Haeger, V; Stulens, Herwig; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Tielemans, L; Gallopyn, G; Depauw P; STALS, Lambert | Journal Contribution | |
| 77 | 1994 | An activation-energy study of the microstructural changes in al-1-percent-si interconnects | Stulens, Herwig; KNUYT, Gilbert; DE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, Lambert | Journal Contribution | |
| 78 | 1993 | AN INTERFACE STUDY OF VARIOUS PVD TIN COATINGS ON PLASMA-NITRIDED AUSTENITIC STAINLESS-STEEL AISI 304 | D'HAEN, Jan; QUAEYHAEGENS, Carl; KNUYT, Gilbert; DE SCHEPPER, Luc; STALS, Lambert; VANSTAPPEN, M | Journal Contribution | |
| 79 | 1993 | ELECTROMIGRATION - INVESTIGATION OF HETEROGENEOUS SYSTEMS | VANHECKE, B; DE SCHEPPER, Luc; DE CEUNINCK, Ward; DHAEGER, V; D'OLIESLAEGER, Marc; BEYNE, E; ROGGEN, J; STALS, Lambert | Journal Contribution | |
| 80 | 1992 | THE INFLUENCE OF CURRENT STRESS ON THE AGING OF AU-ALL-PERCENT-SI(1-PERCENT-CU) BALL-BOND CONTACTS STUDIED BY SEM AND EDX | D'OLIESLAEGER, Marc; DE SCHEPPER, Luc; DE CEUNINCK, Ward; STALS, Lambert | Journal Contribution | |
| 81 | 1991 | INTERFACE STUDY OF TIN-COATED AND TI-TIN-COATED STAINLESS-STEEL AISI-304 WITH ASYMMETRIC GLANCING ANGLE X-RAY-DIFFRACTION AND CLASSICAL BRAGG-BRENTANO X-RAY-DIFFRACTION | QUAEYHAEGENS, Carl; STALS, Lambert; DE SCHEPPER, Luc; VAN STAPPEN, M | Journal Contribution | |
| 82 | 1991 | DETERMINATION OF THE ATTEMPT FREQUENCY FOR RELAXATION PHENOMENA IN AMORPHOUS METALS | DE CEUNINCK, Ward; KNUYT, Gilbert; Stulens, Herwig; DE SCHEPPER, Luc; STALS, Lambert | Journal Contribution | |
| 83 | 1991 | STABILITY OF HELIUM-FILLED PLATELETS IN NICKEL | D'OLIESLAEGER, Marc; KNUYT, Gilbert; DE SCHEPPER, Luc; STALS, Lambert | Journal Contribution | |
| 84 | 1991 | CALCULATION OF SOME METALLIC-GLASS PROPERTIES, BASED ON THE USE OF A GAUSSIAN DISTRIBUTION FOR THE NEAREST-NEIGHBOR DISTANCE .2. DIFFUSION AND VISCOSITY PROPERTIES | KNUYT, Gilbert; STALS, Lambert; DE SCHEPPER, Luc | Journal Contribution | |
| 85 | 1991 | ATOMISTIC COMPUTER-SIMULATION OF THE GROWTH OF HELIUM PLATELETS IN NICKEL | D'OLIESLAEGER, Marc; KNUYT, Gilbert; DE SCHEPPER, Luc; STALS, Lambert | Journal Contribution | |
| 86 | 1991 | CALCULATION OF THE SHEAR MODULUS PROPERTIES OF AMORPHOUS-ALLOYS | STALS, Lambert; DE SCHEPPER, Luc; DE CEUNINCK, Ward; KNUYT, Gilbert | Journal Contribution | |
| 87 | 1991 | A NEW EXPLANATION FOR THE LINEAR INCREASE OF VISCOSITY WITH TIME IN AMORPHOUS-ALLOYS | KNUYT, Gilbert; STALS, Lambert; DE SCHEPPER, Luc; DE CEUNINCK, Ward | Journal Contribution | |
| 88 | 1991 | CHARACTERIZATION OF TIN COATINGS DEPOSITED ON PLASMA NITRIDED TOOL STEEL SURFACES | VANSTAPPEN, M; Malliet, B.; ROOS, JR; CELIS, JP; STALS, Lambert; DE SCHEPPER, Luc | Journal Contribution | |
| 89 | 1991 | CHARACTERIZATION BY GLANCING ANGLE X-RAY-DIFFRACTION OF THE INTERFACE BETWEEN AUSTENITIC STAINLESS-STEEL AISI-304 SUBSTRATES AND A TIN OR TI/TIN PHYSICAL VAPOR-DEPOSITION COATING | VANSTAPPEN, M; Malliet, B.; QUAEYHAEGENS, Carl; STALS, Lambert; DE SCHEPPER, Luc | Journal Contribution | |
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