DE CEUNINCK, Ward

Full Name
DE CEUNINCK, Ward
Email
ward.deceuninck@uhasselt.be
 
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Publications

Results 1-123 of 124 (Search time: 0.002 seconds).

Issue DateTitleContributor(s)TypeCat.
12024Assessing the impact of PV panel climate-based degradation rates on inverter reliability in grid-connected solar energy systemsALAVI, Omid; KAAYA, Ismail; DE JONG, Richard; DE CEUNINCK, Ward; DAENEN, MichaelJournal ContributionA1
22023Carbon capture and utilization for industrial applicationsRAJABLOO, Talieh; Valee, Joris; Marenne, Yves; Coppens, Leo; DE CEUNINCK, WardJournal ContributionA1
32022Potential of petro-chemical sectors for industrial decarbonization_Part IRAJABLOO, Talieh; DE CEUNINCK, WardConference MaterialC2
42022Optimized selection of materials for IGBT module packagingALAVI, Omid; DE CEUNINCK, Ward; DAENEN, MichaelJournal ContributionA1
52022Non-Isolated DC-DC Converters in Fuel Cell Applications: Thermal Analysis and Reliability ComparisonALAVI, Omid; RAJABLOO, Talieh; DE CEUNINCK, Ward; DAENEN, MichaelJournal ContributionA1
62021Environmental management of industrial decarbonization with focus on chemical sectors: A reviewRAJABLOO, Talieh; DE CEUNINCK, Ward; Van Wortswinkel, Luc; Rezakazemi, Mashallah; Aminabhavi, TejrajJournal ContributionA1
72021Reliability Analysis Framework for a Grid-Tied PV-Battery System: Influence of PV and Battery Degradation on Reliability of Power Electronic SystemsALAVI, Omid; VAN DE SANDE, Wieland; VAN CAPPELLEN, Leander; DE CEUNINCK, Ward; DAENEN, Michael; Van De Sande, W.; Van Cappellen, L.; DAENEN, MarcProceedings PaperC2
82021Practical Challenges of High-Power IGBT’s I-V Curve Measurement and Its Importance in Reliability AnalysisALAVI, Omid; VAN CAPPELLEN, Leander; DE CEUNINCK, Ward; DAENEN, MichaelJournal ContributionA1
92020Why and how to adapt PID testing for bifacial PV modules?CAROLUS, Jorne; BREUGELMANS, Robbe; Tsanakas, John; VAN DER HEIDE, Arvid; Voroshazi, Eszter; DE CEUNINCK, Ward; DAENEN, MichaelJournal ContributionA1
102020Searching for a common origin of heat-transfer effects in bio- and chemosensors: A study on thiols as a model systemKHORSHID, Mehran; LOSADA-PEREZ, Patricia; Cornelis, Peter; Dollt, Michele; Ingebrandt, Sven; Glorieux, Christ; RENNER, Frank; VAN GRINSVEN, Bart; DE CEUNINCK, Ward; THOELEN, Ronald; WAGNER, PatrickJournal ContributionA1
112020Economic Study of Battery Profitability in Residential Solar Panel Systems: A Case Study of BelgiumALAVI, Omid; Despeghel, Jolien; DE CEUNINCK, Ward; MEURIS, Marc; Driesen, Johan; DAENEN, MichaelProceedings PaperC1
122020Influence of PV and Battery Degradation on Residential Solar Panel SystemsALAVI, Omid; DE CEUNINCK, Ward; MEURIS, Marc; DAENEN, MichaelProceedings PaperC1
132019Potential-Induced Degradation and Recovery of Perovskite Solar CellsCAROLUS, Jorne; MERCKX, Tamara; PUROHIT, Zeel; Tripathi, Brijesh; BOYEN, Hans-Gerd; AERNOUTS, Tom; DE CEUNINCK, Ward; CONINGS, Bert; DAENEN, MichaelJournal ContributionA1
142019Physics of potential-induced degradation in bifacial p-PERC solar cellsCAROLUS, Jorne; Tsanakas, John. A.; VAN DER HEIDE, Arvid; Voroshazi, Eszter; DE CEUNINCK, Ward; DAENEN, MichaelJournal ContributionA1
152018Mechanical and chemical adhesion at the encapsulant interfaces in laminated photovoltaic modulesNIVELLE, Philippe; BORGERS, Tom; Voroshazi, Eszter; POORTMANS, Jef; D'HAEN, Jan; DE CEUNINCK, Ward; DAENEN, MichaelConference MaterialC2
162018Micro-patterned molecularly imprinted polymer structures on functionalized diamond-coated substrates for testosterone detectionKELLENS, Evelien; BOVE, Hannelore; VANDENRYT, Thijs; LAMBRICHTS, Jeroen; Dekens, Jolien; DRIJKONINGEN, Sien; D'HAEN, Jan; DE CEUNINCK, Ward; THOELEN, Ronald; JUNKERS, Tanja; HAENEN, Ken; ETHIRAJAN, AnithaJournal ContributionA1
172018Mechanical and chemical adhesion at the encapsulant interfaces in laminated photovoltaic modulesNIVELLE, Philippe; BORGERS, Tom; Voroshazi, Eszter; POORTMANS, Jef; D'HAEN, Jan; DE CEUNINCK, Ward; DAENEN, MichaelProceedings PaperC1
182017Voltage dependence of potential-induced degradation and recovery on photovoltaic one-cell laminatesCAROLUS, Jorne; GOVAERTS, Jonathan; Voroshazi, Eszter; DE CEUNINCK, Ward; DAENEN, MichaelProceedings PaperC2
192017Impact of potential-induced degradation (PID) on PV parametersCAROLUS, Jorne; Govaerts, Jonathan; Voroshazi, Eszter; DE CEUNINCK, Ward; DAENEN, MichaelConference MaterialC2
202017Irreversible damage at high levels of potential-induced degradation on photovoltaic modulesCAROLUS, Jorne; DE CEUNINCK, Ward; DAENEN, MichaelProceedings PaperC1
212017Single-Shot Detection of Neurotransmitters in Whole-Blood Samples by Means of the Heat-Transfer Method in Combination with Synthetic ReceptorsVANDENRYT, Thijs; VAN GRINSVEN, Bart; EERSELS, Kasper; Cornelis, Peter; Kholwadia, Safira; CLEIJ, Thomas; THOELEN, Ronald; DE CEUNINCK, Ward; PEETERS, Marloes; WAGNER, PatrickJournal ContributionA1
222016Heat-transfer based characterization of DNA on synthetic sapphire chipsMURIB, Mohammed Sharif; YEAP, Weng Siang; Eurlings, Y.; VAN GRINSVEN, Bart; BOYEN, Hans-Gerd; CONINGS, Bert; MICHIELS, Luc; AMELOOT, Marcel; CARLEER, Robert; Warmer, J.; Kaul, P.; HAENEN, Ken; Schoening, M.J.; DE CEUNINCK, Ward; WAGNER, PatrickJournal ContributionA1
232015Improving the sensitivity of the heat-transfer method (HTM) for cancer cell detection with optimized sensor chipsEERSELS, Kasper; VAN GRINSVEN, Bart; VANDENRYT, Thijs; JIMENEZ MONROY, Kathia; PEETERS, Marloes; SOMERS, Veerle; CLEIJ, Thomas; THOELEN, Ronald; DE CEUNINCK, Ward; Puettmann, C.; BOS, Gerard; Stein, C.; Barth, Stefan; GERMERAAD, Wilfred; DILIEN, Hanne; WAGNER, PatrickJournal ContributionA1
242015Heat-Transfer-Method-Based Cell Culture Quality Assay through Cell Detection by Surface Imprinted PolymersEERSELS, Kasper; VAN GRINSVEN, Bart; KHORSHID, Mehran; SOMERS, Veerle; Puttmann, Christiane; Stein, Christoph; Barth, Stefan; DILIEN, Hanne; BOS, Gerard; GERMERAAD, Wilfred; CLEIJ, Thomas; THOELEN, Ronald; DE CEUNINCK, Ward; WAGNER, PatrickJournal ContributionA1
252015Label-free Protein Detection Based on the Heat-Transfer Method-A Case Study with the Peanut Allergen Ara h 1 and Aptamer-Based Synthetic ReceptorsPEETERS, Marloes; VAN GRINSVEN, Bart; CLEIJ, Thomas; Jimenez-Monroy, Kathia Lorena; Cornelis, Peter; Perez-Ruiz, Elena; WACKERS, Gideon; THOELEN, Ronald; DE CEUNINCK, Ward; Lammertyn, Jeroen; WAGNER, PatrickJournal ContributionA1
262015Evaluation of theophylline imprinted polypyrrole filmBaleviciute, Ieva; Ratautaite, Vilma; Ramanaviciene, Almira; Balevicius, Zigmas; BROEDERS, Jeroen; CROUX, Dieter; MCDONALD, Matthew; VAHIDPOUR, Farnoosh; THOELEN, Ronald; DE CEUNINCK, Ward; HAENEN, Ken; NESLADEK, Milos; Reza, Alfonsas; Ramanavicius, ArunasJournal ContributionA1
272014Rapid fabrication of micron-sized CVD-diamond structures by microfluidic contact printingVANDENRYT, Thijs; GRIETEN, Lars; JANSSENS, Stoffel; VAN GRINSVEN, Bart; HAENEN, Ken; RUTTENS, Bart; D'HAEN, Jan; WAGNER, Patrick; THOELEN, Ronald; DE CEUNINCK, WardJournal ContributionA1
282014Array Formatting of the Heat-Transfer Method (HTM) for the Detection of Small Organic Molecules by Molecularly Imprinted PolymersWACKERS, Gideon; VANDENRYT, Thijs; Cornelis, Peter; KELLENS, Evelien; THOELEN, Ronald; DE CEUNINCK, Ward; LOSADA-PEREZ, Patricia; VAN GRINSVEN, Bart; PEETERS, Marloes; WAGNER, PatrickJournal ContributionA1
292014Phase transitions in lipid vesicles detected by a complementary set of methods: heat-transfer measurements, adiabatic scanning calorimetry, and dissipation-mode quartz crystal microbalanceLOSADA-PEREZ, Patricia; Jimenez-Monroy, K. L.; VAN GRINSVEN, Bart; Leys, J.; JANSSENS, Stoffel; PEETERS, Marloes; Glorieux, C.; Thoen, J.; HAENEN, Ken; DE CEUNINCK, Ward; WAGNER, PatrickJournal ContributionA1
302014Heat transfer resistance as a tool to quantify hybridization efficiency of DNA on a nanocrystalline diamond surfaceCornelis, P.; VANDENRYT, Thijs; WACKERS, Gideon; KELLENS, Evelien; LOSADA-PEREZ, Patricia; THOELEN, Ronald; DE CEUNINCK, Ward; EERSELS, Kasper; DRIJKONINGEN, Sien; HAENEN, Ken; PEETERS, Marloes; VAN GRINSVEN, Bart; WAGNER, PatrickJournal ContributionA1
312014Heat-Transfer Resistance Measurement Method (HTM)-Based Cell Detection at Trace Levels Using a Progressive Enrichment Approach with Highly Selective Cell-Binding Surface ImprintsBERS, Karolien; EERSELS, Kasper; VAN GRINSVEN, Bart; Daemen, Mat; BOGIE, Jeroen; HENDRIKS, Jerome; Bouwmans, Evelien E.; PĂĽttmann, Christiane; Stein, Christoph; Barth, Stefan; BOS, Gerard; GERMERAAD, Wilfred; DE CEUNINCK, Ward; WAGNER, PatrickJournal ContributionA1
322014Heat-transfer-based detection of SNPs in the PAH gene of PKU patientsVANDEN BON, Natalie; VAN GRINSVEN, Bart; MURIB, Mohammed Sharif; YEAP, Weng Siang; HAENEN, Ken; DE CEUNINCK, Ward; WAGNER, Patrick; AMELOOT, Marcel; VERMEEREN, Veronique; MICHIELS, LucJournal ContributionA1
332014Photonic detection and characterization of DNA using sapphire microspheresMURIB, Mohammed Sharif; YEAP, Weng Siang; Martens, Daan; Bienstman, Peter; DE CEUNINCK, Ward; VAN GRINSVEN, Bart; Schoening, Michael J.; MICHIELS, Luc; HAENEN, Ken; AMELOOT, Marcel; Serpenguzel, Ali; WAGNER, PatrickJournal ContributionA1
342013Optimizing the Thermal Read-Out Technique for MIP-Based Biomimetic Sensors: Towards Nanomolar Detection LimitsGeerets, Bram; PEETERS, Marloes; VAN GRINSVEN, Bart; BERS, Karolien; DE CEUNINCK, Ward; WAGNER, PatrickJournal ContributionA1
352013Combining Electrochemical Impedance Spectroscopy and Surface Plasmon Resonance into one Simultaneous Read-Out System for the Detection of Surface InteractionsVANDENRYT, Thijs; Pohl, Andrea; VAN GRINSVEN, Bart; THOELEN, Ronald; DE CEUNINCK, Ward; WAGNER, Patrick; Opitz, JörgJournal ContributionA1
362013Cell proliferation monitoring by multiplexed electrochemical impedance spectroscopy on microwell assaysDUCHATEAU, Stijn; BROEDERS, Jeroen; CROUX, Dieter; RIGO, Jean-Michel; WAGNER, Patrick; THOELEN, Ronald; DE CEUNINCK, WardProceedings PaperC1
372013Heat-transfer-based detection of L-nicotine, histamine, and serotonin using molecularly imprinted polymers as biomimetic receptorsPEETERS, Marloes; Csipai, P.; Geerets, B.; WEUSTENRAED, Ans; VAN GRINSVEN, Bart; THOELEN, Ronald; Gruber, J.; DE CEUNINCK, Ward; CLEIJ, Thomas; Troost, F. J.; WAGNER, PatrickJournal ContributionA1
382013Molecular imprinted polymer films on RFID tags: a first step towards disposable packaging sensorsCROUX, Dieter; VANGERVEN, Tim; BROEDERS, Jeroen; BOUTSEN, Jan; PEETERS, Marloes; DUCHATEAU, Stijn; CLEIJ, Thomas; DEFERME, Wim; WAGNER, Patrick; THOELEN, Ronald; DE CEUNINCK, WardJournal ContributionA1
392013Selective Identification of Macrophages and Cancer Cells Based on Thermal Transport through Surface-Imprinted Polymer LayersEERSELS, Kasper; VAN GRINSVEN, Bart; ETHIRAJAN, Anitha; TIMMERMANS, Silke; JIMENEZ MONROY, Kathia; BOGIE, Jeroen; PUNNIYAKOTI, Sathya; VANDENRYT, Thijs; HENDRIKS, Jerome; CLEIJ, Thomas; Daemen, Mat J. A. P.; SOMERS, Veerle; DE CEUNINCK, Ward; WAGNER, PatrickJournal ContributionA1
402013Mobile Application for Impedance-Based Biomimetic Sensor ReadoutBROEDERS, Jeroen; CROUX, Dieter; PEETERS, Marloes; Beyens, Thomas; DUCHATEAU, Stijn; CLEIJ, Thomas; WAGNER, Patrick; THOELEN, Ronald; DE CEUNINCK, WardJournal ContributionA1
412013Implementing heat transfer resistivity as a key element in a nanocrystalline diamond based single nucleotide polymorphism detection arrayBERS, Karolien; VAN GRINSVEN, Bart; VANDENRYT, Thijs; MURIB, Mohammed Sharif; JANSSENS, Wim; Geerets, B.; AMELOOT, Marcel; HAENEN, Ken; MICHIELS, Luc; DE CEUNINCK, Ward; WAGNER, PatrickJournal ContributionA1
422013Electronic monitoring of chemical DNA denaturation on nanocrystalline diamond electrodes with different molarities and flow ratesMURIB, Mohammed Sharif; VAN GRINSVEN, Bart; GRIETEN, Lars; JANSSENS DE VAREBEKE, Sebastien; VERMEEREN, Veronique; EERSELS, Kasper; BROEDERS, Jeroen; AMELOOT, Marcel; MICHIELS, Luc; DE CEUNINCK, Ward; HAENEN, Ken; Schoening, M. J.; WAGNER, PatrickJournal ContributionA1
432012Analysis of an optical biosensor based on elastic light scattering from diamond-, glass-, and sapphire microspheresMURIB, Mohammed Sharif; Tran, Anh Quang; DE CEUNINCK, Ward; Schöning, J.M.; NESLADEK, Milos; SerpengĂĽzel, Ali; WAGNER, PatrickJournal ContributionA1
442012Embedded unit for point-of-care impedance based biosensor readoutBROEDERS, Jeroen; CROUX, Dieter; WEUSTENRAED, Ans; CLEIJ, Thomas; WAGNER, Patrick; DE CEUNINCK, Ward; Vanaken, Wouter; DUCHATEAU, Stijn; THOELEN, RonaldProceedings PaperC1
452012Development of multichannel quartz crystal microbalances for MIP-based biosensingCROUX, Dieter; WEUSTENRAED, Ans; POBEDINSKAS, Paulius; HOREMANS, Frederik; DILIEN, Hanne; HAENEN, Ken; CLEIJ, Thomas; WAGNER, Patrick; THOELEN, Ronald; DE CEUNINCK, WardJournal ContributionA1
462012Heat-Transfer Resistance at Solid–Liquid Interfaces: A Tool for the Detection of Single-Nucleotide Polymorphisms in DNAVAN GRINSVEN, Bart; VANDEN BON, Natalie; GRIETEN, Lars; MURIB, Mohammed Sharif; JIMENEZ MONROY, Kathia; JANSSENS, Stoffel; HAENEN, Ken; Schöning, Michael J.; VERMEEREN, Veronique; AMELOOT, Marcel; MICHIELS, Luc; THOELEN, Ronald; DE CEUNINCK, Ward; WAGNER, Patrick; Strauven, HanneloreJournal ContributionA1
472011Optimization of a boron doped nanocrystalline diamond temperature regulator for sensing applicationsCLUKERS, Tim; VAN GRINSVEN, Bart; VANDENRYT, Thijs; JANSSENS, Stoffel; WAGNER, Patrick; DE CEUNINCK, Ward; THOELEN, Ronald; DAENEN, Michael; HAENEN, KenProceedings PaperC1
482011Miniaturised eight-channel impedance spectroscopy unit as sensor platform for biosensor applicationsBROEDERS, Jeroen; DUCHATEAU, Stijn; VAN GRINSVEN, Bart; Vanaken, Wouter; PEETERS, Marloes; CLEIJ, Thomas; THOELEN, Ronald; WAGNER, Patrick; DE CEUNINCK, WardJournal ContributionA1
492011Rapid assessment of the stability of DNA duplexes by impedimetric real-time monitoring of chemically induced denaturationVAN GRINSVEN, Bart; VANDEN BON, Natalie; GRIETEN, Lars; MURIB, Mohammed Sharif; JANSSENS, Stoffel; HAENEN, Ken; Schneider, E.; Ingebrandt, S.; Schöning, M.J.; VERMEEREN, Veronique; AMELOOT, Marcel; MICHIELS, Luc; THOELEN, Ronald; DE CEUNINCK, Ward; WAGNER, PatrickJournal ContributionA1
502010Apparent and steady-state etch rates in thin film etching and under-etching of microstructures: I. ModellingVAN BAREL, Gregory; Mertens, Luc; DE CEUNINCK, Ward; Witvrouw, AnnJournal ContributionA1
512010Apparent and steady-state etch rates in thin film etching and under-etching of microstructures: II. CharacterizationVAN BAREL, Gregory; Du Bois, Bert; Van Hoof, Rita; De Wachter, Jef; DE CEUNINCK, Ward; Witvrouw, AnnJournal ContributionA1
522010Boron doped nanocrystalline diamond temperature regulator for sensing applicationsCLUKERS, Tim; VAN GRINSVEN, Bart; VANDERYT, Thijs; JANSSENS, Stoffel; WAGNER, Patrick; DE CEUNINCK, Ward; THOELEN, Ronald; DAENEN, Michael; HAENEN, KenJournal ContributionA1
532010Customized impedance spectroscopy device as possible sensor platform for biosensor applicationsVAN GRINSVEN, Bart; VANDENRYT, Thijs; DUCHATEAU, Stijn; GAULKE, Andreas; GRIETEN, Lars; THOELEN, Ronald; Ingebrandt, Sven; DE CEUNINCK, Ward; WAGNER, PatrickJournal ContributionA1
542008The influence of different surface terminations on electrical transport and emission properties for freestanding single crystalline (100) CVD diamond samplesDEFERME, Wim; BOGDAN, Anna; HAENEN, Ken; DE CEUNINCK, Ward; Flipse, K.; NESLADEK, MilosProceedings PaperC1
552008The influence of geometrical imperfections in micromachined cantilevers on the extracted Young's modulus using a simple modelVAN BAREL, Gregory; DE CEUNINCK, Ward; Witvrouw, AnnJournal ContributionA1
562008Increasing the mean grain size in copper films and featuresVANSTREELS, Kris; Brongersma, S.H.; Tokei, Zs.; Carbonell, L; DE CEUNINCK, Ward; D'HAEN, Jan; D'OLIESLAEGER, MarcJournal ContributionA1
572007Microstructural evolution of cu interconnect under AC, pulsed DC and DC current stressBIESEMANS, Leen; VANSTREELS, Kris; BRONGERSMA, Sywert; D'HAEN, Jan; DE CEUNINCK, Ward; D'OLIESLAEGER, MarcProceedings PaperC1
582007High sputter bias super secondary grain growth initiation (In structures)VANSTREELS, Kris; BRONGERSMA, Sywert; D'HAEN, Jan; DEMUYNCK, Steven; DE CEUNINCK, Ward; CALUWAERTS, Rudi; D'OLIESLAEGER, MarcProceedings PaperC1
592007Study of time-dependent dielectric breakdown on gate oxide capacitors at high temperatureMOONEN, Rob; Vanmeerbeek, P; LEKENS, Geert; DE CEUNINCK, Ward; Moens, P.; Boutsen, J.Proceedings PaperC1
602007Electrical transport and defect spectroscopy of free standing single crystal CVD diamond prepared from methane rich mixturesBOGDAN, Andrey; BOGDAN, Anna; DE CEUNINCK, Ward; HAENEN, Ken; NESLADEK, MilosProceedings PaperC1
612007Electrical transport measurements and emission properties of freestanding single crystalline CVD diamond samplesDEFERME, Wim; BOGDAN, Anna; BOGDAN, Andrey; HAENEN, Ken; DE CEUNINCK, Ward; NESLADEK, MilosJournal ContributionA1
622007Lifetime modeling of intrinsic gate oxide breakdown at high temperatureMOONEN, Rob; Vanmeerbeek, P; LEKENS, Geert; DE CEUNINCK, Ward; Moens, P.; BOUTSEN, JanJournal ContributionA1
632006Super secondary grain growth initiation in electroplated copperVANSTREELS, Kris; Brongersma, SH; Demuynck, S; Carbonell, L; D'HAEN, Jan; DE CEUNINCK, Ward; D'OLIESLAEGER, Marc; Maex, KProceedings PaperC1
642005A new method for the lifetime determination of submicron metal interconnects by means of a parallel test structureVANSTREELS, Kris; D'OLIESLAEGER, Marc; DE CEUNINCK, Ward; D'HAEN, Jan; Maex, KarenJournal ContributionA1
652005Understanding Oxide Degradation Mechanisms in ultra-thin SiO2 through High-Speed, High Resolution in-situ MeasurementsARESU, Stefano; DE CEUNINCK, Ward; Degraeve, R.; Kaczer, B.; KNUYT, Gilbert; DE SCHEPPER, LucJournal ContributionA1
662004Super secondary grain growth in the barrier/seedlayer systemVANSTREELS, Kris; Brongersma, S.H.; Demuynck, S.; D'HAEN, Jan; DE CEUNINCK, Ward; D'OLIESLAEGER, Marc; Maex, KarenProceedings PaperC1
672004A new method for the lifetime determination of submicron metal interconnects by means of a parallel test structureVANSTREELS, Kris; D'OLIESLAEGER, Marc; DE CEUNINCK, Ward; D'HAEN, Jan; Maex, KarenProceedings PaperC1
682004MTF test system with AC based dynamic joule correction for electromigration tests on interconnectsBIESEMANS, Leen; Schepers, K; VANSTREELS, Kris; D'HAEN, Jan; DE CEUNINCK, Ward; D'OLIESLAEGER, MarcJournal ContributionA1
692004Evidence for source side injection hot carrier effects on lateral DMOS transistorsARESU, Stefano; DE CEUNINCK, Ward; Van den Bosch, G; Groeseneken, G; Moens, P.; MANCA, Jean; Wojciechowski, D; Gassot, PJournal ContributionA1
702003Advantage of in-situ to ex-situ techniques as reliability tool: aging kinetcs of Imec's MCM-D discrete passive devicesSoussan, P.; LEKENS, Geert; DREESEN, Raf; DE CEUNINCK, Ward; Beyne, E.Proceedings PaperC2
712003Copper deposition and subsequent grain structure evolution in narrow linesBrongersma, SH; D'HAEN, Jan; VANSTREELS, Kris; DE CEUNINCK, Ward; Vervoort, I; Maex, KProceedings PaperC1
722003Advantage of In-situ over Ex-situ techniques as reliability tool: Aging kinetics of Imec's MCM-D discrete passives devices.Soussan, P; LEKENS, Geert; DREESEN, Raf; DE CEUNINCK, Ward; Beyne, EJournal ContributionA1
732003A new method for the analysis of high-resolution SILC dataARESU, Stefano; DE CEUNINCK, Ward; KNUYT, Gilbert; MERTENS, Johan; MANCA, Jean; DE SCHEPPER, Luc; DEGRAEVE, Maria; Kaczer, B.; D'OLIESLAEGER, Marc; D'HAEN, JanJournal ContributionA1
742002How reliable are reliability tests?Tielemans, L; Rongen, R; DE CEUNINCK, WardJournal ContributionA1
752002Exploring the limits of Arrhenius-based life testing with heterojunction bipolar transistor technologyPETERSEN, Rainer; DE CEUNINCK, Ward; D'HAEN, Jan; D'OLIESLAEGER, Marc; DE SCHEPPER, Luc; Vendier, O; Blanck, HJournal ContributionA1
762002Statistical aspects of the degradation of LDD nMOSFETsANDRIES, Ellen; DREESEN, Raf; CROES, Kristof; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Groeseneken, G; Lo, KF; D'OLIESLAEGER, Marc; D'HAEN, JanJournal ContributionA1
772002A comparison between state-of-the-art 'gilch' and 'sulphinyl' synthesised MDMO-PPV/PCBM bulk hetero-junction solar cellsMUNTERS, Tom; MARTENS, Tom; GORIS, Ludwig; VRINDTS, Veerle; MANCA, Jean; LUTSEN, Laurence; DE CEUNINCK, Ward; VANDERZANDE, Dirk; DE SCHEPPER, Luc; GELAN, Jan; Sariciftci, NS; Brabec, CJJournal ContributionA1
782002High-resolution SILC measurements of thin SiO2 ultra low voltagesARESU, Stefano; DE CEUNINCK, Ward; DREESEN, Raf; CROES, Kristof; ANDRIES, Ellen; MANCA, Jean; DE SCHEPPER, Luc; DEGRAEVE, Maria; Kaczer, B.; D'OLIESLAEGER, Marc; D'HAEN, JanJournal ContributionA1
792001Determination of the thermal resistance and current exponent of heterojunction bipolar transistors for reliability evaluationPETERSEN, Rainer; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Vendier, O; Blanck, H; Pons, DJournal ContributionA1
802001A new degradation model and lifetime extrapolation technique for lightly doped drain nMOSFETs under hot-carrier degradationDREESEN, Raf; CROES, Kristof; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Pergoot, A; Groeseneken, GJournal ContributionA1
812001High-resolution in-situ study of gold electromigration: test time reductionCROES, Kristof; DREESEN, Raf; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Tielemans, L; Van der Wel, PJournal ContributionA1
822000A novel non-destructive method for assessing the thermal resistance of power GaAs RF-MMIC amplifiersPETERSEN, Rainer; DE CEUNINCK, Ward; DE SCHEPPER, LucProceedings PaperC1
832000Reliability aspects of high temperature power MOSFETsMANCA, Jean; Wondrak, W; Schaper, W; CROES, Kristof; D'HAEN, Jan; DE CEUNINCK, Ward; Dieval, B; Hartnagel, HL; D'OLIESLAEGER, Marc; DE SCHEPPER, LucJournal ContributionA1
842000The stability of Pt heater and temperature sensing elements for silicon integrated tin oxide gas sensorsEsch, H; Huyberechts, G; Mertens, R.; Maes, Guido; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, LucJournal ContributionA1
852000In-situ SEM observation of electromigration in thin metal films at accelerated stress conditionsD'HAEN, Jan; VAN OLMEN, Jan; BEELEN, Zjef; MANCA, Jean; MARTENS, Tom; DE CEUNINCK, Ward; D'OLIESLAEGER, Marc; DE SCHEPPER, Luc; Cannaerts, M; Maex, KJournal ContributionA1
862000A method to minimize test times for accelerated testing of pHEMT's by analysis of the elctronic fingerprint of the initial stage of degradationPETERSEN, Rainer; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Muraro, J.-L.Journal ContributionA1
871999The kinetics of the early stages of electromigration and concurrent temperature induced processes in thin film metallisations studied by means of an in-situ high resolution resistometric techniqueVAN OLMEN, Jan; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; D'Haeger, V; Witvrouw, A; Maex, K; Vandevelde, B; Beyne, E; Tielemans, LJournal Contribution
881999Dynamics of electromigration induced void/hillock growth and precipitation/dissolution of addition elements studied by in-situ scanning electron microscopy resistance measurementsD'HAEN, Jan; COSEMANS, Patrick Peter; MANCA, Jean; LEKENS, Geert; MARTENS, Tom; DE CEUNINCK, Ward; D'OLIESLAEGER, Marc; DE SCHEPPER, Luc; Maex, KJournal Contribution
891999Modelling hot-carrier degradation of LDD NMOSFETs by using a high-resolution measurement technique.DREESEN, Raf; CROES, Kristof; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Pergoot, A; Groeseneken, GJournal Contribution
901999High electrical resistivity of CVD-diamondMANCA, Jean; NESLADEK, Milos; Neelen, M; QUAEYHAEGENS, Carl; DE SCHEPPER, Luc; DE CEUNINCK, WardJournal Contribution
911998The dependence of stress induced voiding on line width studied by conventional and high resolution resistance measurementsWitvrouw, A; Maex, K; DE CEUNINCK, Ward; LEKENS, Geert; D'HAEN, Jan; DE SCHEPPER, LucJournal Contribution
921998The influence of addition elements on the early resistance changes observed during electromigration testing of Al metal linesDE CEUNINCK, Ward; D'Haeger, V; VAN OLMEN, Jan; Witvrouw, A; Maex, K; DE SCHEPPER, Luc; De Pauw, P; Pergoot, AJournal Contribution
931998Overview of the kinetics of the early stages of electromigration under low (= realistic) current density stressVAN OLMEN, Jan; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; D'Haeger, V; Witvrouw, A; Maex, KJournal Contribution
941998Electrical characterization and reliability evaluation of capacitors by means of in situ leakage current measurementsMANCA, Jean; CROES, Kristof; DE SCHEPPER, Luc; DE CEUNINCK, Ward; STALS, Lambert; Jacques, L; Tielemans, L; Gerrits, N; Hoppener, RJournal Contribution
951998Study of Cu diffusion in an Al-1 wt%Si-0.5 wt%Cu bond pad with an Al-1 wt%Si bond wire attached using scanning electron microscopyCOSEMANS, Patrick; D'HAEN, Jan; Witvrouw, A; Proost, J; D'OLIESLAEGER, Marc; DE CEUNINCK, Ward; Maex, K; DE SCHEPPER, LucJournal Contribution
961998Bimodal failure behaviour of metal film resistorsCROES, Kristof; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Tielemans, LJournal Contribution
971998Localized monitoring of electromigration with early resistance change measurementsMANCA, Jean; CROES, Kristof; DE CEUNINCK, Ward; D'Haeger, V; D'HAEN, Jan; Depauw, P; Tielemans, L; DE SCHEPPER, LucJournal Contribution
981998A new precursor to electroconducting conjugated polymers: Synthesis and opto-electrical properties of luminescent devices based on these PPV derivativesBijnens, W; Van Der Borght, M; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; VANDERZANDE, Dirk; STALS, Lambert; GELAN, JanJournal Contribution
991998Effect of oxygen on the electrical characteristics of PPV-LEDsMANCA, Jean; Bijnens, W; KIEBOOMS, Rafael; D'HAEN, Jan; D'OLIESLAEGER, Marc; WU, Ting-Di; DE CEUNINCK, Ward; DE SCHEPPER, Luc; VANDERZANDE, Dirk; GELAN, Jan; STALS, MarkJournal Contribution
1001998Electrical field induced ageing of polymer light-emitting diodes in an oxygen-rich atmosphere studied by emission microscopy, scanning electron microscopy and secondary ion mass spectroscopyBijnens, W; De Wolf, I; MANCA, Jean; D'HAEN, Jan; WU, Ting-Di; D'OLIESLAEGER, Marc; Beyne, E; KIEBOOMS, Rafael; VANDERZANDE, Dirk; GELAN, Jan; DE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
1011998The time of 'guessing' your failure time distribution is over!CROES, Kristof; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; MOLENBERGHS, GeertJournal Contribution
1021997A high resolution method for measuring hot carrier degradation in matched transistor pairsDREESEN, Raf; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Groeseneken, G.Proceedings Paper
1031997The thermally balanced bridge technique (TBBT): A new high resolution resistometric measurement technique for the study of electromigration-induced early resistance changes in metal stripesVAN OLMEN, Jan; DE CEUNINCK, Ward; DE SCHEPPER, Luc; GOLDONI, Alessandro; Cervini, A; Fantini, FJournal Contribution
1041997In-situ study of the degradation behaviour of GaAs MESFETs for hi-rel applicationsPETERSEN, Rainer; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Gregoris, GJournal Contribution
1051997Design of a new test structure for the study of electromigration with early resistance change measurementsDE CEUNINCK, Ward; MANCA, Jean; D'Haeger, V; VAN OLMEN, Jan; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
1061996Evaluation on a two-day time scale of high-reliability electronic assemblies by in-situ electrical and opto-mechanical test techniquesGregoris, G.; Bouton, F.; DeKeukeleire, C.; Siliprandi, P.; Baio, F.; DE SCHEPPER, Luc; DE CEUNINCK, Ward; Tielemans, L.; Ahrens, T.; Krumm, M.Journal Contribution
1071996A new technique to characterize the early stages of electromigration-induced resistance changes at low current densitiesDHaeger, V; DE CEUNINCK, Ward; KNUYT, Gilbert; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
1081996Study of the microstructure of IC interconnect metallisations using analytical transmission electron microscopy and secondary ion mass spectrometryCOSEMANS, Patrick Peter; D'OLIESLAEGER, Marc; DE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
1091996Characterization of the early stages of electromigration in Al-based metal lines by means of a high resloution resistance monitoring technique based on an extremely stable ambient temperatureDE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, Lambert; d' Haeger, V.Proceedings Paper
1101996A re-interpretation of the existence of a spectrum of activation energies for the microstructural changes in Al 1% Si linesStulens, Herwig; KNUYT, Gilbert; DE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
1111996Imaging of the ageing on organic electroluminescent diodes, under different atmospheres by impedance spectroscopy, scanning electron microscopy and SIMS depth profiling analysisBijnens, W; MANCA, Jean; WU, Ting-Di; D'OLIESLAEGER, Marc; VANDERZANDE, Dirk; GELAN, Jan; DE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
1121995IN-SITU FAILURE-DETECTION IN THICK-FILM MULTILAYER SYSTEMSMANCA, Jean; DE SCHEPPER, Luc; DE CEUNINCK, Ward; D'OLIESLAEGER, Marc; STALS, LambertJournal Contribution
1131995Evaluation on a two days time scale of high reliability electronic assemblies by in-situ electrical and optomechanical tests techniquesGregoris, G.; Bouton, F.; de Keukeleire, C.; Siliprandi, P.; Baio, F.; DE SCHEPPER, Luc; DE CEUNINCK, Ward; Tielemans, L.; Ahrens, T.; Krumm, M.Proceedings Paper
1141994Reliability study of on-chip interconnects - prediction of electromigration resistance on a short-time scaleDE CEUNINCK, Ward; D'Haeger, V; Stulens, Herwig; DE SCHEPPER, Luc; STALS, LambertProceedings Paper
1151994The use of early resistance and early tcr changes to predict the reliability of on-chip interconnectsD'Haeger, V; Stulens, Herwig; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Tielemans, L; Gallopyn, G; Depauw P; STALS, LambertJournal Contribution
1161994An activation-energy study of the microstructural changes in al-1-percent-si interconnectsStulens, Herwig; KNUYT, Gilbert; DE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
1171993DERIVATION OF AN ACTIVATION-ENERGY SPECTRUM FOR DEFECT PROCESSES FROM ISOTHERMAL MEASUREMENTS, USING A MINIMIZATION PRINCIPLE AND FOURIER-ANALYSISKNUYT, Gilbert; Stulens, Herwig; DE CEUNINCK, Ward; STALS, LambertJournal Contribution
1181993ELECTROMIGRATION - INVESTIGATION OF HETEROGENEOUS SYSTEMSVANHECKE, B; DE SCHEPPER, Luc; DE CEUNINCK, Ward; DHAEGER, V; D'OLIESLAEGER, Marc; BEYNE, E; ROGGEN, J; STALS, LambertJournal Contribution
1191992THE INFLUENCE OF CURRENT STRESS ON THE AGING OF AU-ALL-PERCENT-SI(1-PERCENT-CU) BALL-BOND CONTACTS STUDIED BY SEM AND EDXD'OLIESLAEGER, Marc; DE SCHEPPER, Luc; DE CEUNINCK, Ward; STALS, LambertJournal Contribution
1201992A SIMPLE METHOD OF CALCULATING AN ENERGY-SPECTRUM FROM ISOTHERMAL MEASUREMENTS, USING FOURIER TECHNIQUESKNUYT, Gilbert; Stulens, Herwig; DE CEUNINCK, Ward; BEX, Geert Jan; STALS, LambertJournal Contribution
1211992A SIMPLE METHOD FOR CALCULATING AN ENERGY-SPECTRUM FOR DEFECT ANNEALING FROM A CONSTANT HEATING RATE EXPERIMENTStulens, Herwig; KNUYT, Gilbert; DE CEUNINCK, Ward; STALS, LambertJournal Contribution
1221991DETERMINATION OF THE ATTEMPT FREQUENCY FOR RELAXATION PHENOMENA IN AMORPHOUS METALSDE CEUNINCK, Ward; KNUYT, Gilbert; Stulens, Herwig; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
1231991CALCULATION OF THE SHEAR MODULUS PROPERTIES OF AMORPHOUS-ALLOYSSTALS, Lambert; DE SCHEPPER, Luc; DE CEUNINCK, Ward; KNUYT, GilbertJournal Contribution